Laser-induced incandescence of silicon surface under 1064-nm excitation

Laser-induced incandescence (LII) of silicon surface is investigated under the
 excitation by a Q-switched YAG:Nd laser. With the increase of laser irradiation dose, the
 increase of LII signal is observed, which is attended by visible changes of the surface
 geometry. The an...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2012
Hauptverfasser: Kopyshinsky, A.V., Zelensky, S.E., Gomon, E.A., Rozouvan, S.G., Kolesnik, A.S.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118730
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Laser-induced incandescence of silicon surface under 1064-nm excitation / A.V. Kopyshinsky, S.E. Zelensky, E.A. Gomon, S.G. Rozouvan, A.S. Kolesnik // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 376-381. — Бібліогр.: 26 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:Laser-induced incandescence (LII) of silicon surface is investigated under the
 excitation by a Q-switched YAG:Nd laser. With the increase of laser irradiation dose, the
 increase of LII signal is observed, which is attended by visible changes of the surface
 geometry. The anomalous behavior of the parameter of non-linearity of LII is observed
 with the increase of laser excitation power.
ISSN:1560-8034