Peculiarities of charge carriers transport in submicron Si-Ge whiskers

The paper presents an analysis of impact of charge carriers transport mechanisms on the thermoelectric properties of Si-Ge submicron whiskers. Based on the resistance temperature dependences the value of activation energy for conduction submicron designs was estimated and compared with the ones for...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Functional Materials
Datum:2014
Hauptverfasser: Druzhinin, A.A., Dolgolenko, A.P., Ostrovskii, I.P., Khoverko, Yu.N., Nichkalo, S.I., Kogut, Iu.R.
Format: Artikel
Sprache:Englisch
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2014
Schlagworte:
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/119084
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Peculiarities of charge carriers transport in submicron Si-Ge whiskers / A.A.Druzhinin, A.P.Dolgolenko, I.P.Ostrovskii, Yu.N.Khoverko, S.I.Nichkalo, Iu.R.Kogut // Functional Materials. — 2015. — Т. 22, № 1. — С. 27-33. — Бібліогр.: 18 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862576086061154304
author Druzhinin, A.A.
Dolgolenko, A.P.
Ostrovskii, I.P.
Khoverko, Yu.N.
Nichkalo, S.I.
Kogut, Iu.R.
author_facet Druzhinin, A.A.
Dolgolenko, A.P.
Ostrovskii, I.P.
Khoverko, Yu.N.
Nichkalo, S.I.
Kogut, Iu.R.
citation_txt Peculiarities of charge carriers transport in submicron Si-Ge whiskers / A.A.Druzhinin, A.P.Dolgolenko, I.P.Ostrovskii, Yu.N.Khoverko, S.I.Nichkalo, Iu.R.Kogut // Functional Materials. — 2015. — Т. 22, № 1. — С. 27-33. — Бібліогр.: 18 назв. — англ.
collection DSpace DC
container_title Functional Materials
description The paper presents an analysis of impact of charge carriers transport mechanisms on the thermoelectric properties of Si-Ge submicron whiskers. Based on the resistance temperature dependences the value of activation energy for conduction submicron designs was estimated and compared with the ones for micron-scale crystals. It is shown that the activation energy of ground state ε1 of boron impurity for the Si-Ge whiskers with a diameter of 200 nm is 29.6 meV, which is typical for the bulk materials, whereas ε₂ was 3.2 meV. It is suggested that the unusual high value of ε₂ caused by inhomogeneous stress at the interface between the core and nanoporous shell of the submicron whisker due to their lattice mismatch. This effect can be used to create gauges with a thermoelectric principle of operation for cryogenic temperatures.
first_indexed 2025-11-26T14:23:58Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-119084
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1027-5495
language English
last_indexed 2025-11-26T14:23:58Z
publishDate 2014
publisher НТК «Інститут монокристалів» НАН України
record_format dspace
spelling Druzhinin, A.A.
Dolgolenko, A.P.
Ostrovskii, I.P.
Khoverko, Yu.N.
Nichkalo, S.I.
Kogut, Iu.R.
2017-06-03T18:59:00Z
2017-06-03T18:59:00Z
2014
Peculiarities of charge carriers transport in submicron Si-Ge whiskers / A.A.Druzhinin, A.P.Dolgolenko, I.P.Ostrovskii, Yu.N.Khoverko, S.I.Nichkalo, Iu.R.Kogut // Functional Materials. — 2015. — Т. 22, № 1. — С. 27-33. — Бібліогр.: 18 назв. — англ.
1027-5495
DOI: http://dx.doi.org/10.15407/fm22.01.027
https://nasplib.isofts.kiev.ua/handle/123456789/119084
The paper presents an analysis of impact of charge carriers transport mechanisms on the thermoelectric properties of Si-Ge submicron whiskers. Based on the resistance temperature dependences the value of activation energy for conduction submicron designs was estimated and compared with the ones for micron-scale crystals. It is shown that the activation energy of ground state ε1 of boron impurity for the Si-Ge whiskers with a diameter of 200 nm is 29.6 meV, which is typical for the bulk materials, whereas ε₂ was 3.2 meV. It is suggested that the unusual high value of ε₂ caused by inhomogeneous stress at the interface between the core and nanoporous shell of the submicron whisker due to their lattice mismatch. This effect can be used to create gauges with a thermoelectric principle of operation for cryogenic temperatures.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Characterization and properties
Peculiarities of charge carriers transport in submicron Si-Ge whiskers
Article
published earlier
spellingShingle Peculiarities of charge carriers transport in submicron Si-Ge whiskers
Druzhinin, A.A.
Dolgolenko, A.P.
Ostrovskii, I.P.
Khoverko, Yu.N.
Nichkalo, S.I.
Kogut, Iu.R.
Characterization and properties
title Peculiarities of charge carriers transport in submicron Si-Ge whiskers
title_full Peculiarities of charge carriers transport in submicron Si-Ge whiskers
title_fullStr Peculiarities of charge carriers transport in submicron Si-Ge whiskers
title_full_unstemmed Peculiarities of charge carriers transport in submicron Si-Ge whiskers
title_short Peculiarities of charge carriers transport in submicron Si-Ge whiskers
title_sort peculiarities of charge carriers transport in submicron si-ge whiskers
topic Characterization and properties
topic_facet Characterization and properties
url https://nasplib.isofts.kiev.ua/handle/123456789/119084
work_keys_str_mv AT druzhininaa peculiaritiesofchargecarrierstransportinsubmicronsigewhiskers
AT dolgolenkoap peculiaritiesofchargecarrierstransportinsubmicronsigewhiskers
AT ostrovskiiip peculiaritiesofchargecarrierstransportinsubmicronsigewhiskers
AT khoverkoyun peculiaritiesofchargecarrierstransportinsubmicronsigewhiskers
AT nichkalosi peculiaritiesofchargecarrierstransportinsubmicronsigewhiskers
AT kogutiur peculiaritiesofchargecarrierstransportinsubmicronsigewhiskers