Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration

• Datum: 1999
• Hauptverfasser: Rengevych, O.V., Shirshov, Yu.M., Ushenin, Yu.V, Beketov, A.G.
• Format: Artikel
• Sprache: English
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
• Schriftenreihe: Semiconductor Physics Quantum Electronics & Optoelectronics
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/119109
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Separate determination of thickness and optical parameters by surface plasmon resonance: accuracy consideration / O.V. Rengevych, Yu.M. Shirshov, Yu.V. Ushenin, A.G. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 2. — С. 28-35. — Бібліогр.: 28 назв. — англ.

Reliability and precision of characterization of surface layers by SPR method was evaluated with relation to the experimental conditions and the strategy of extracting the film parameters. Consideration is bound up with sensor applications of SPR phenomenon and focused at problems of separate extrac...