X-ray photoelectron spectroscopy of Sn₂P₂S₆ crystals
The paper presents the X-ray photoelectron spectra (XPS) of the valence band (VB) and of the core levels (CL) of uniaxial ferroelectric Sn₂P₂S₆ single crystals from different crystallographic planes in both paraelectric and ferroelectric phases. The XPS were measured with monochromatized Al Kα rad...
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| Veröffentlicht in: | Condensed Matter Physics |
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| Datum: | 2008 |
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики конденсованих систем НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119343 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | X-ray photoelectron spectroscopy of Sn₂P₂S₆ crystals / J. Grigas, E. Talik, V. Lazauskas, Yu.M. Vysochanskii, R. Yevych, M. Adamiec, V. Nelkinas // Condensed Matter Physics. — 2008. — Т. 11, № 3(55). — С. 473-482. — Бібліогр.: 7 назв. — англ. |