X-ray photoelectron spectroscopy of Sn₂P₂S₆ crystals

• Published in: Condensed Matter Physics
• Date: 2008
• Main Authors: Grigas, J., Talik, E., Lazauskas, V., Vysochanskii, Yu.M., Yevych, R., Adamiec, M., Nelkinas, V.
• Format: Article
• Language: English
• Published: Інститут фізики конденсованих систем НАН України 2008
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/119343
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: X-ray photoelectron spectroscopy of Sn₂P₂S₆ crystals / J. Grigas, E. Talik, V. Lazauskas, Yu.M. Vysochanskii, R. Yevych, M. Adamiec, V. Nelkinas // Condensed Matter Physics. — 2008. — Т. 11, № 3(55). — С. 473-482. — Бібліогр.: 7 назв. — англ.

The paper presents the X-ray photoelectron spectra (XPS) of the valence band (VB) and of the core levels (CL) of uniaxial ferroelectric Sn₂P₂S₆ single crystals from different crystallographic planes in both paraelectric and ferroelectric phases. The XPS were measured with monochromatized Al Kα rad...