APA (7th ed.) Citation

Dmitruk, N., Karimov, A., Konakova, R., Kudryk, Y., & Sachenko, A. (2005). Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Dmitruk, N.L, A.V Karimov, R.V Konakova, Ya.Ya Kudryk, and A.V Sachenko. "Investigation of Electrical C Haracteristics of Heteroepitaxial Structures as a Function of Microrelief and Manufacturing Technology Features." Semiconductor Physics Quantum Electronics & Optoelectronics 2005.

MLA (8th ed.) Citation

Dmitruk, N.L, et al. "Investigation of Electrical C Haracteristics of Heteroepitaxial Structures as a Function of Microrelief and Manufacturing Technology Features." Semiconductor Physics Quantum Electronics & Optoelectronics, 2005.

Warning: These citations may not always be 100% accurate.