Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features

Over a wide temperature range (77…400 K), we studied I-V curves of photoelectric converter (solar cell) prototypes made on the basis of p-AlxGa₁-xAs– p-GaAs–n-GaAs–n⁺-GaAs heteroepitaxial structures grown on smooth or microrelief n⁺-GaAs substrates using the standard liquid phase epitaxy (LPE) and t...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2005
Hauptverfasser: Dmitruk, N.L., Karimov, A.V., Konakova, R.V., Kudryk, Ya.Ya., Sachenko, A.V.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/119964
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Zitieren:Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features / N.L. Dmitruk, A.V. Karimov, R.V. Konakova, Ya.Ya. Kudryk, A.V. Sachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 1. — С. 46-52. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-119964
record_format dspace
spelling Dmitruk, N.L.
Karimov, A.V.
Konakova, R.V.
Kudryk, Ya.Ya.
Sachenko, A.V.
2017-06-10T13:41:40Z
2017-06-10T13:41:40Z
2005
Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features / N.L. Dmitruk, A.V. Karimov, R.V. Konakova, Ya.Ya. Kudryk, A.V. Sachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 1. — С. 46-52. — Бібліогр.: 6 назв. — англ.
1560-8034
PACS: 72.40.+w, 72.20.j, 84.60.j.
https://nasplib.isofts.kiev.ua/handle/123456789/119964
Over a wide temperature range (77…400 K), we studied I-V curves of photoelectric converter (solar cell) prototypes made on the basis of p-AlxGa₁-xAs– p-GaAs–n-GaAs–n⁺-GaAs heteroepitaxial structures grown on smooth or microrelief n⁺-GaAs substrates using the standard liquid phase epitaxy (LPE) and the capillary LPE from a confined volume, as well as the effect of some external factors (thermal treatment and 60Со γ-irradiation) on the current flow mechanisms. At temperatures ≤ 200 K, the tunnel component of the forward current was predominant in all the smooth samples studied up to the voltages close to 1 V, while at room temperatures all three components (diffusion, recombination and tunnel) were of the same order. This is evidenced, in particular, by the dependencys of the effective ideality factor on the applied voltage. Predominance of the tunnel current component in a wide temperature range at small biases was observed for all the solar cells obtained on the textured n⁺-GaAs substrates. In this case, an additional factor favoring the increase of the tunnel current component was relief irregularities with small curvature radii.
This work was supported by the Science and Technology Center in Ukraine (Grant UZB-56(J)).
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
spellingShingle Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
Dmitruk, N.L.
Karimov, A.V.
Konakova, R.V.
Kudryk, Ya.Ya.
Sachenko, A.V.
title_short Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
title_full Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
title_fullStr Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
title_full_unstemmed Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
title_sort investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features
author Dmitruk, N.L.
Karimov, A.V.
Konakova, R.V.
Kudryk, Ya.Ya.
Sachenko, A.V.
author_facet Dmitruk, N.L.
Karimov, A.V.
Konakova, R.V.
Kudryk, Ya.Ya.
Sachenko, A.V.
publishDate 2005
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Over a wide temperature range (77…400 K), we studied I-V curves of photoelectric converter (solar cell) prototypes made on the basis of p-AlxGa₁-xAs– p-GaAs–n-GaAs–n⁺-GaAs heteroepitaxial structures grown on smooth or microrelief n⁺-GaAs substrates using the standard liquid phase epitaxy (LPE) and the capillary LPE from a confined volume, as well as the effect of some external factors (thermal treatment and 60Со γ-irradiation) on the current flow mechanisms. At temperatures ≤ 200 K, the tunnel component of the forward current was predominant in all the smooth samples studied up to the voltages close to 1 V, while at room temperatures all three components (diffusion, recombination and tunnel) were of the same order. This is evidenced, in particular, by the dependencys of the effective ideality factor on the applied voltage. Predominance of the tunnel current component in a wide temperature range at small biases was observed for all the solar cells obtained on the textured n⁺-GaAs substrates. In this case, an additional factor favoring the increase of the tunnel current component was relief irregularities with small curvature radii.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/119964
citation_txt Investigation of electrical c haracteristics of heteroepitaxial structures as a function of microrelief and manufacturing technology features / N.L. Dmitruk, A.V. Karimov, R.V. Konakova, Ya.Ya. Kudryk, A.V. Sachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 1. — С. 46-52. — Бібліогр.: 6 назв. — англ.
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AT konakovarv investigationofelectricalcharacteristicsofheteroepitaxialstructuresasafunctionofmicroreliefandmanufacturingtechnologyfeatures
AT kudrykyaya investigationofelectricalcharacteristicsofheteroepitaxialstructuresasafunctionofmicroreliefandmanufacturingtechnologyfeatures
AT sachenkoav investigationofelectricalcharacteristicsofheteroepitaxialstructuresasafunctionofmicroreliefandmanufacturingtechnologyfeatures
first_indexed 2025-12-07T15:23:29Z
last_indexed 2025-12-07T15:23:29Z
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