The distribution of field-induced charges in C₆₀ fullerite

The profile of injected charges in a C₆₀-based field-effect transistor (FET) is considered. A simple
 scheme for calculations of the charge distribution between the 2D layers of C₆₀ molecules is
 founded on a small magnitude of the interball electron hopping. Analytical solutions of...

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Опубліковано в: :Физика низких температур
Дата:2006
Автори: Kuprievich, V.A., Kapitanchuk, O.L., Shramko, O.V., Kudritska, Z.G.
Формат: Стаття
Мова:Англійська
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
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Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/120055
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The distribution of field-induced charges in C₆₀ fullerite / V.A. Kuprievich, O.L. Kapitanchuk, O.V. Shramko, Z.G. Kudritska // Физика низких температур. — 2006. — Т. 32, № 1. — С. 125-128. — Бібліогр.: 16 назв. — рос.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862729911784964096
author Kuprievich, V.A.
Kapitanchuk, O.L.
Shramko, O.V.
Kudritska, Z.G.
author_facet Kuprievich, V.A.
Kapitanchuk, O.L.
Shramko, O.V.
Kudritska, Z.G.
citation_txt The distribution of field-induced charges in C₆₀ fullerite / V.A. Kuprievich, O.L. Kapitanchuk, O.V. Shramko, Z.G. Kudritska // Физика низких температур. — 2006. — Т. 32, № 1. — С. 125-128. — Бібліогр.: 16 назв. — рос.
collection DSpace DC
container_title Физика низких температур
description The profile of injected charges in a C₆₀-based field-effect transistor (FET) is considered. A simple
 scheme for calculations of the charge distribution between the 2D layers of C₆₀ molecules is
 founded on a small magnitude of the interball electron hopping. Analytical solutions of the equations
 for the charge distributions are obtained in the limits of thick and thin crystals. The charge
 density is shown to drop exponentially with the crystal depth. The calculations predict the relative
 part of induced charges involved in the surface layer to be 3/4 and 2/3 in the cases of electron
 and hole injection, respectively.
first_indexed 2025-12-07T19:17:30Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-120055
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 0132-6414
language English
last_indexed 2025-12-07T19:17:30Z
publishDate 2006
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
record_format dspace
spelling Kuprievich, V.A.
Kapitanchuk, O.L.
Shramko, O.V.
Kudritska, Z.G.
2017-06-10T19:51:57Z
2017-06-10T19:51:57Z
2006
The distribution of field-induced charges in C₆₀ fullerite / V.A. Kuprievich, O.L. Kapitanchuk, O.V. Shramko, Z.G. Kudritska // Физика низких температур. — 2006. — Т. 32, № 1. — С. 125-128. — Бібліогр.: 16 назв. — рос.
0132-6414
PACS: 71.10.–w, 31.25.Eb, 73.90.+f
https://nasplib.isofts.kiev.ua/handle/123456789/120055
The profile of injected charges in a C₆₀-based field-effect transistor (FET) is considered. A simple
 scheme for calculations of the charge distribution between the 2D layers of C₆₀ molecules is
 founded on a small magnitude of the interball electron hopping. Analytical solutions of the equations
 for the charge distributions are obtained in the limits of thick and thin crystals. The charge
 density is shown to drop exponentially with the crystal depth. The calculations predict the relative
 part of induced charges involved in the surface layer to be 3/4 and 2/3 in the cases of electron
 and hole injection, respectively.
The authors are thankful to Prof. V. Loktev and
 Prof. E. Petrov for useful discussions. This work was
 partially supported under contract of the Ukrainian
 Scientific Program «Nanostructures, Nanomaterials
 and Nanotechnologies» (project No. 8/05—H).
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Низкоразмерные и неупорядоченные системы
The distribution of field-induced charges in C₆₀ fullerite
Article
published earlier
spellingShingle The distribution of field-induced charges in C₆₀ fullerite
Kuprievich, V.A.
Kapitanchuk, O.L.
Shramko, O.V.
Kudritska, Z.G.
Низкоразмерные и неупорядоченные системы
title The distribution of field-induced charges in C₆₀ fullerite
title_full The distribution of field-induced charges in C₆₀ fullerite
title_fullStr The distribution of field-induced charges in C₆₀ fullerite
title_full_unstemmed The distribution of field-induced charges in C₆₀ fullerite
title_short The distribution of field-induced charges in C₆₀ fullerite
title_sort distribution of field-induced charges in c₆₀ fullerite
topic Низкоразмерные и неупорядоченные системы
topic_facet Низкоразмерные и неупорядоченные системы
url https://nasplib.isofts.kiev.ua/handle/123456789/120055
work_keys_str_mv AT kuprievichva thedistributionoffieldinducedchargesinc60fullerite
AT kapitanchukol thedistributionoffieldinducedchargesinc60fullerite
AT shramkoov thedistributionoffieldinducedchargesinc60fullerite
AT kudritskazg thedistributionoffieldinducedchargesinc60fullerite
AT kuprievichva distributionoffieldinducedchargesinc60fullerite
AT kapitanchukol distributionoffieldinducedchargesinc60fullerite
AT shramkoov distributionoffieldinducedchargesinc60fullerite
AT kudritskazg distributionoffieldinducedchargesinc60fullerite