Laser scanning microscopy of HTS films and devices (Review Article)

• Published in: Физика низких температур
• Date: 2006
• Main Authors: Zhuravel, A.P., Sivakov, A.G., Turutanov, O.G., Omelyanchouk, A.N., Anlage, S.M., Lukashenko, A., Ustinov, A.V., Abraimov, D.
• Format: Article
• Language: English
• Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
• Subjects: Experimental Methods and Applications
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/120206
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Laser scanning microscopy of HTS films and devices
 (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
 method of testing high–Tc materials and devices. The earlier results obtained by the authors are
 briefly reviewed. Some novel applications of the LSM are illustrated, including imaging th...