Laser scanning microscopy of HTS films and devices (Review Article)

• Veröffentlicht in: Физика низких температур
• Datum: 2006
• Hauptverfasser: Zhuravel, A.P., Sivakov, A.G., Turutanov, O.G., Omelyanchouk, A.N., Anlage, S.M., Lukashenko, A., Ustinov, A.V., Abraimov, D.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
• Schlagworte: Experimental Methods and Applications
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/120206
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Laser scanning microscopy of HTS films and devices
 (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
 method of testing high–Tc materials and devices. The earlier results obtained by the authors are
 briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS
 responses in rf mode, probing the superconducting properties of HTS single crystals, development
 of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of
 resistivity in HTS materials is proven by LSM imaging.