Laser scanning microscopy of HTS films and devices (Review Article)
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 2006 |
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| Sprache: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2006
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/120206 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
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Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. 2017-06-11T12:44:24Z 2017-06-11T12:44:24Z 2006 Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. 0132-6414 PACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j https://nasplib.isofts.kiev.ua/handle/123456789/120206 The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses in rf mode, probing the superconducting properties of HTS single crystals, development of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of resistivity in HTS materials is proven by LSM imaging. We acknowledge valuable contribution from Stephen Remillard (Agile Devices, USA). Yu. Koval (Erlangen University, Germany) is acknowledged for making high-quality samples by electron lithography. This work has been supported in part by the NSF/GOALI DMR-0201261, the program «Nanosystems, nanomaterials, and nanotechnology» of the National Academy of Sciences of Ukraine, and a DFG Grant «Vortex matter in mesoscopic superconductors». en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Experimental Methods and Applications Laser scanning microscopy of HTS films and devices (Review Article) Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Laser scanning microscopy of HTS films and devices (Review Article) |
| spellingShingle |
Laser scanning microscopy of HTS films and devices (Review Article) Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. Experimental Methods and Applications |
| title_short |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_full |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_fullStr |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_full_unstemmed |
Laser scanning microscopy of HTS films and devices (Review Article) |
| title_sort |
laser scanning microscopy of hts films and devices (review article) |
| author |
Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
| author_facet |
Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
| topic |
Experimental Methods and Applications |
| topic_facet |
Experimental Methods and Applications |
| publishDate |
2006 |
| language |
English |
| container_title |
Физика низких температур |
| publisher |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| format |
Article |
| description |
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
method of testing high–Tc materials and devices. The earlier results obtained by the authors are
briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS
responses in rf mode, probing the superconducting properties of HTS single crystals, development
of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of
resistivity in HTS materials is proven by LSM imaging.
|
| issn |
0132-6414 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/120206 |
| citation_txt |
Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
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| first_indexed |
2025-12-07T20:26:08Z |
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2025-12-07T20:26:08Z |
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