Laser scanning microscopy of HTS films and devices (Review Article)
The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
 method of testing high–Tc materials and devices. The earlier results obtained by the authors are
 briefly reviewed. Some novel applications of the LSM are illustrated, including imaging th...
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| Опубліковано в: : | Физика низких температур |
|---|---|
| Дата: | 2006 |
| Автори: | , , , , , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2006
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| Теми: | |
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/120206 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Laser scanning microscopy of HTS films and devices
 (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862742514215157760 |
|---|---|
| author | Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
| author_facet | Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. |
| citation_txt | Laser scanning microscopy of HTS films and devices
 (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. |
| collection | DSpace DC |
| container_title | Физика низких температур |
| description | The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
method of testing high–Tc materials and devices. The earlier results obtained by the authors are
briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS
responses in rf mode, probing the superconducting properties of HTS single crystals, development
of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of
resistivity in HTS materials is proven by LSM imaging.
|
| first_indexed | 2025-12-07T20:26:08Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-120206 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 0132-6414 |
| language | English |
| last_indexed | 2025-12-07T20:26:08Z |
| publishDate | 2006 |
| publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| record_format | dspace |
| spelling | Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. 2017-06-11T12:44:24Z 2017-06-11T12:44:24Z 2006 Laser scanning microscopy of HTS films and devices
 (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ. 0132-6414 PACS: 68.37.–d, 74.25.Nf, 74.78.Bz, 85.25.–j https://nasplib.isofts.kiev.ua/handle/123456789/120206 The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved
 method of testing high–Tc materials and devices. The earlier results obtained by the authors are
 briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS
 responses in rf mode, probing the superconducting properties of HTS single crystals, development
 of two-beam laser scanning microscopy. The existence of the phase slip lines mechanism of
 resistivity in HTS materials is proven by LSM imaging. We acknowledge valuable contribution from Stephen
 Remillard (Agile Devices, USA). Yu. Koval (Erlangen
 University, Germany) is acknowledged for making
 high-quality samples by electron lithography. This
 work has been supported in part by the NSF/GOALI
 DMR-0201261, the program «Nanosystems, nanomaterials,
 and nanotechnology» of the National Academy
 of Sciences of Ukraine, and a DFG Grant «Vortex
 matter in mesoscopic superconductors». en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Experimental Methods and Applications Laser scanning microscopy of HTS films and devices (Review Article) Article published earlier |
| spellingShingle | Laser scanning microscopy of HTS films and devices (Review Article) Zhuravel, A.P. Sivakov, A.G. Turutanov, O.G. Omelyanchouk, A.N. Anlage, S.M. Lukashenko, A. Ustinov, A.V. Abraimov, D. Experimental Methods and Applications |
| title | Laser scanning microscopy of HTS films and devices (Review Article) |
| title_full | Laser scanning microscopy of HTS films and devices (Review Article) |
| title_fullStr | Laser scanning microscopy of HTS films and devices (Review Article) |
| title_full_unstemmed | Laser scanning microscopy of HTS films and devices (Review Article) |
| title_short | Laser scanning microscopy of HTS films and devices (Review Article) |
| title_sort | laser scanning microscopy of hts films and devices (review article) |
| topic | Experimental Methods and Applications |
| topic_facet | Experimental Methods and Applications |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/120206 |
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