Laser scanning microscopy of HTS films and devices (Review Article)

Laser scanning microscopy of HTS films and devices (Review Article)

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Физика низких температур
Datum:2006
Hauptverfasser: Zhuravel, A.P., Sivakov, A.G., Turutanov, O.G., Omelyanchouk, A.N., Anlage, S.M., Lukashenko, A., Ustinov, A.V., Abraimov, D.
Format: Artikel
Sprache:English
Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
Schlagworte:
Experimental Methods and Applications
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/120206
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine

Online

https://nasplib.isofts.kiev.ua/handle/123456789/120206

Ähnliche Einträge