Laser scanning microscopy of HTS films and devices (Review Article)

• Veröffentlicht in: Физика низких температур
• Datum: 2006
• Hauptverfasser: Zhuravel, A.P., Sivakov, A.G., Turutanov, O.G., Omelyanchouk, A.N., Anlage, S.M., Lukashenko, A., Ustinov, A.V., Abraimov, D.
• Format: Artikel
• Sprache: English
• Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
• Schlagworte: Experimental Methods and Applications
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/120206
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Laser scanning microscopy of HTS films and devices (Review Article) / A.P. Zhuravel, A.G. Sivakov, O.G. Turutanov, A.N. Omelyanchouk, S.M. Anlage, A. Lukashenko, A.V. Ustinov, D. Abraimov // Физика низких температур. — 2006. — Т. 32, № 6. — С. 775–794. — Бібліогр.: 74 назв. — англ.

The work describes the capabilities of laser scanning microscopy (LSM) as a spatially-resolved method of testing high–Tc materials and devices. The earlier results obtained by the authors are briefly reviewed. Some novel applications of the LSM are illustrated, including imaging the HTS responses...