Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study

• Date: 1999
• Main Authors: Belyaeva, A.I., Galuza, A.A., Grebennik, T.G., Yuriyev, V.P.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
• Series: Semiconductor Physics Quantum Electronics & Optoelectronics
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/120246
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study / A.I. Belyaeva, A.A. Galuza, T.G. Grebennik, V.P. Yuriyev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 61-65. — Бібліогр.: 5 назв. — англ.

A multiple angle ellipsometric method is used for measurements of thin film layers on substrates. The method evaluates fundamental optical constants and thicknesses of the film layers. Dielectric functions of the surface layers on the gadolinium gallium garnet (GdGaG) substrate – commonly used subst...