Contacts for silicon IMPATT and pick-off diodes

We studied experimentally: (i) the ways to fabricate metal-n⁺-Si ohmic contacts with Schottky barriers; (ii) how elemental, structural and phase composition of barrier layers in the contact system, as well as of the barrier layer-semiconductor interface, depend on the formation techniques and condit...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2000
Main Authors: Boltovets, N.S., Goncharuk, N.M., Krivutsa, V.A., Chaika, V.E., Konakova, R.V., Milenin, V.V., Soloviev, E.A., Tagaev, M.B., Voitsikhovskyi, D.I.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121159
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Contacts for silicon IMPATT and pick-off diodes / N.S. Boltovets, N.M. Goncharuk, V.A. Krivutsa, V.E. Chaika, R.V. Konakova, V.V. Milenin, E.A. Soloviev, M.B. Tagaev, D.I. Voitsikhovskyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 352-358. — Бібліогр.: 13 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Boltovets, N.S.
Goncharuk, N.M.
Krivutsa, V.A.
Chaika, V.E.
Konakova, R.V.
Milenin, V.V.
Soloviev, E.A.
Tagaev, M.B.
Voitsikhovskyi, D.I.
author_facet Boltovets, N.S.
Goncharuk, N.M.
Krivutsa, V.A.
Chaika, V.E.
Konakova, R.V.
Milenin, V.V.
Soloviev, E.A.
Tagaev, M.B.
Voitsikhovskyi, D.I.
citation_txt Contacts for silicon IMPATT and pick-off diodes / N.S. Boltovets, N.M. Goncharuk, V.A. Krivutsa, V.E. Chaika, R.V. Konakova, V.V. Milenin, E.A. Soloviev, M.B. Tagaev, D.I. Voitsikhovskyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 352-358. — Бібліогр.: 13 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description We studied experimentally: (i) the ways to fabricate metal-n⁺-Si ohmic contacts with Schottky barriers; (ii) how elemental, structural and phase composition of barrier layers in the contact system, as well as of the barrier layer-semiconductor interface, depend on the formation techniques and conditions; (iii) their evolution at heating and under ⁶⁰Co g-radiation. Some versions of technique to form palladium, titanium, gold barrier layers using thermal and magnetron sputtering, as well as thermionic synthesis, are discussed. We investigated the structure, as well as phase and elemental composition, of both the barrier layers in contact system and barrier layer-semiconductor interface as a function of the formation techniques and conditions, and their evolution under heating and ⁶⁰Co g-radiation. For technological processes of contact system and mesa formation a simulation was performed to determine what contact systems are promising for use in manufacturing technology of silicon IMPATT and pick-off diodes for the millimeter wavelength range. Some conditions have been found that are necessary for production of high-performance contact systems. The heat and radiation tolerance ranges for barrier structures were considered. It was shown that the Si-Ti-TiB2-Au contact systems are best suited for production of silicon IMPATT and pick-off diode structures intended for the millimeter wavelength range.
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last_indexed 2025-12-07T17:29:50Z
publishDate 2000
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Boltovets, N.S.
Goncharuk, N.M.
Krivutsa, V.A.
Chaika, V.E.
Konakova, R.V.
Milenin, V.V.
Soloviev, E.A.
Tagaev, M.B.
Voitsikhovskyi, D.I.
2017-06-13T15:55:51Z
2017-06-13T15:55:51Z
2000
Contacts for silicon IMPATT and pick-off diodes / N.S. Boltovets, N.M. Goncharuk, V.A. Krivutsa, V.E. Chaika, R.V. Konakova, V.V. Milenin, E.A. Soloviev, M.B. Tagaev, D.I. Voitsikhovskyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 352-358. — Бібліогр.: 13 назв. — англ.
1560-8034
PACS 73.40. Ns, 68.60 Dv
https://nasplib.isofts.kiev.ua/handle/123456789/121159
We studied experimentally: (i) the ways to fabricate metal-n⁺-Si ohmic contacts with Schottky barriers; (ii) how elemental, structural and phase composition of barrier layers in the contact system, as well as of the barrier layer-semiconductor interface, depend on the formation techniques and conditions; (iii) their evolution at heating and under ⁶⁰Co g-radiation. Some versions of technique to form palladium, titanium, gold barrier layers using thermal and magnetron sputtering, as well as thermionic synthesis, are discussed. We investigated the structure, as well as phase and elemental composition, of both the barrier layers in contact system and barrier layer-semiconductor interface as a function of the formation techniques and conditions, and their evolution under heating and ⁶⁰Co g-radiation. For technological processes of contact system and mesa formation a simulation was performed to determine what contact systems are promising for use in manufacturing technology of silicon IMPATT and pick-off diodes for the millimeter wavelength range. Some conditions have been found that are necessary for production of high-performance contact systems. The heat and radiation tolerance ranges for barrier structures were considered. It was shown that the Si-Ti-TiB2-Au contact systems are best suited for production of silicon IMPATT and pick-off diode structures intended for the millimeter wavelength range.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Contacts for silicon IMPATT and pick-off diodes
Article
published earlier
spellingShingle Contacts for silicon IMPATT and pick-off diodes
Boltovets, N.S.
Goncharuk, N.M.
Krivutsa, V.A.
Chaika, V.E.
Konakova, R.V.
Milenin, V.V.
Soloviev, E.A.
Tagaev, M.B.
Voitsikhovskyi, D.I.
title Contacts for silicon IMPATT and pick-off diodes
title_full Contacts for silicon IMPATT and pick-off diodes
title_fullStr Contacts for silicon IMPATT and pick-off diodes
title_full_unstemmed Contacts for silicon IMPATT and pick-off diodes
title_short Contacts for silicon IMPATT and pick-off diodes
title_sort contacts for silicon impatt and pick-off diodes
url https://nasplib.isofts.kiev.ua/handle/123456789/121159
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AT konakovarv contactsforsiliconimpattandpickoffdiodes
AT mileninvv contactsforsiliconimpattandpickoffdiodes
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