Degradation of electrooptical characteristics of serial GaP light-emitting diodes, caused by fast electrons
The study of electrical and optical characteristics of GaP LEDs irradiated with electrons (E = 2 MeV, Ф = 0…10¹⁵ cm⁻²) was performed. Especial interest was focused on appearing of S-type instability in current-voltage characteristics and its mechanism in accord with the model by K. Maeda. Made in th...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2015 |
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2015
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/121204 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Degradation of electrooptical characteristics of serial GaP light-emitting diodes, caused by fast electrons / O.V. Konoreva, M.V. Lytovchenko, Ye.V. Malyi, I.V. Petrenko, M.B. Pinkovska, V.P. Tartachnyk, V.V. Shlapatska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 3. — С. 312-316. — Бібліогр.: 11 назв. — англ. |