Structural changes in molten CdTe

Shear viscosity (h) measurements of CdTe and CdTe + 2 at% In melts were performed using a cup viscometer up to 1403 K. The h(T) dependencies obtained during slow heating and cooling (Vh/c = = 10-15 K/h) show hysteresys near a melting point. According to the η(T) dependencies data drastic changes the...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2000
Hauptverfasser: Shcherbak, L., Feychuk, P., Plevachuk, Yu., Dong, Ch., Sklyarchuk, V.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121214
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Structural changes in molten CdTe / L. Shcherbak, P. Feychuk, Yu. Plevachuk, Ch. Dong, V. Sklyarchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 4. — С. 456-459. — Бібліогр.: 20 назв. — англ.

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