Houk, Y., Nazarov, A., Turchanikov, V., Lysenko, V., Andriaensen, S., & Flandre, D. (2006). Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Houk, Y., A.N Nazarov, V.I Turchanikov, V.S Lysenko, S. Andriaensen, und D. Flandre. "Characterization of Charge Trapping Processes in Fully-depleted UNIBOND SOI MOSFET Subjected to γ-irradiation." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.
MLA-Zitierstil (8. Ausg.)Houk, Y., et al. "Characterization of Charge Trapping Processes in Fully-depleted UNIBOND SOI MOSFET Subjected to γ-irradiation." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.