APA (7th ed.) Citation

Houk, Y., Nazarov, A., Turchanikov, V., Lysenko, V., Andriaensen, S., & Flandre, D. (2006). Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Houk, Y., A.N Nazarov, V.I Turchanikov, V.S Lysenko, S. Andriaensen, and D. Flandre. "Characterization of Charge Trapping Processes in Fully-depleted UNIBOND SOI MOSFET Subjected to γ-irradiation." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.

MLA (8th ed.) Citation

Houk, Y., et al. "Characterization of Charge Trapping Processes in Fully-depleted UNIBOND SOI MOSFET Subjected to γ-irradiation." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.

Warning: These citations may not always be 100% accurate.