Houk, Y., Nazarov, A., Turchanikov, V., Lysenko, V., Andriaensen, S., & Flandre, D. (2006). Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Houk, Y., A.N Nazarov, V.I Turchanikov, V.S Lysenko, S. Andriaensen, та D. Flandre. "Characterization of Charge Trapping Processes in Fully-depleted UNIBOND SOI MOSFET Subjected to γ-irradiation." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.
Стиль цитування MLA (8-ме видання)Houk, Y., et al. "Characterization of Charge Trapping Processes in Fully-depleted UNIBOND SOI MOSFET Subjected to γ-irradiation." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.