p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy

(Ge₂)x(GaAs)₁₋x graded gap layers were grown using the method of liquid phase epitaxy on GaAs substrates. Investigated are distributions of chemical components along the thickness of the epitaxial layer. In accord to the scan patterns obtained in characteristic X-rays, the layers have a perfect stru...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2005
Main Authors: Sapaev, B., Saidov, A.S., Sapaev, I.B.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121540
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy / AUTHORS // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 33-34. — Бібліогр.: 2 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121540
record_format dspace
spelling Sapaev, B.
Saidov, A.S.
Sapaev, I.B.
2017-06-14T16:02:06Z
2017-06-14T16:02:06Z
2005
p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy / AUTHORS // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 33-34. — Бібліогр.: 2 назв. — англ.
1560-8034
PACS 68.55.Ac, 81.15.-z
https://nasplib.isofts.kiev.ua/handle/123456789/121540
(Ge₂)x(GaAs)₁₋x graded gap layers were grown using the method of liquid phase epitaxy on GaAs substrates. Investigated are distributions of chemical components along the thickness of the epitaxial layer. In accord to the scan patterns obtained in characteristic X-rays, the layers have a perfect structure, and the component distributions both along the thickness and the interface are rather monotonous, macroscopic defects and metal inclusions are absent. In the epitaxial layers, we created p-n junctions by diffusion of Zn from a gas phase. We studied the possibilities of using the GaAs-(Ge₂)x(GaAs)₁−x structures as solar converters including the near infra-red region. In this case, the GaAs substrate serves as a filter for light quanta with the energy hν < EgGaAs. The conversion efficiency dependences on the gradient x and the p-n junction position inside the (Ge₂)x(GaAs)₁−x graded gap layer are also shown.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
spellingShingle p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
Sapaev, B.
Saidov, A.S.
Sapaev, I.B.
title_short p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
title_full p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
title_fullStr p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
title_full_unstemmed p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy
title_sort p-n junctions obtained in (ge₂)x(gaas)₁₋x varizone solid solutions by liquid phase epitaxy
author Sapaev, B.
Saidov, A.S.
Sapaev, I.B.
author_facet Sapaev, B.
Saidov, A.S.
Sapaev, I.B.
publishDate 2005
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description (Ge₂)x(GaAs)₁₋x graded gap layers were grown using the method of liquid phase epitaxy on GaAs substrates. Investigated are distributions of chemical components along the thickness of the epitaxial layer. In accord to the scan patterns obtained in characteristic X-rays, the layers have a perfect structure, and the component distributions both along the thickness and the interface are rather monotonous, macroscopic defects and metal inclusions are absent. In the epitaxial layers, we created p-n junctions by diffusion of Zn from a gas phase. We studied the possibilities of using the GaAs-(Ge₂)x(GaAs)₁−x structures as solar converters including the near infra-red region. In this case, the GaAs substrate serves as a filter for light quanta with the energy hν < EgGaAs. The conversion efficiency dependences on the gradient x and the p-n junction position inside the (Ge₂)x(GaAs)₁−x graded gap layer are also shown.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121540
citation_txt p-n junctions obtained in (Ge₂)x(GaAs)₁₋x varizone solid solutions by liquid phase epitaxy / AUTHORS // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 33-34. — Бібліогр.: 2 назв. — англ.
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AT saidovas pnjunctionsobtainedinge2xgaas1xvarizonesolidsolutionsbyliquidphaseepitaxy
AT sapaevib pnjunctionsobtainedinge2xgaas1xvarizonesolidsolutionsbyliquidphaseepitaxy
first_indexed 2025-11-25T21:02:32Z
last_indexed 2025-11-25T21:02:32Z
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fulltext Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 4. P. 33-34. © 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine 33 Fig. 1. Scheme of the cascade solar cell based on (Ge2)x(GaAs)1−x graded gap structure: 1 – n-GaAs-substrate, 2 – variable gap solid solution n-(Ge2)x(GaAs), 3 – p-(Ge2)x(GaAs)1−x. PACS 68.55.Ac, 81.15.-z p-n junctions obtained in (Ge2)x(GaAs)1–x varizone solid solutions by liquid phase epitaxy B. Sapaev, A.S. Saidov, I.B. Sapaev Physical and Technical Institute of Uzbek Academy of Sciences, 2b, G. Mavlanov str.,700084 Tashkent, Republic of Uzbekistan E-mail: bayram@physic.uzsci.net Abstract. (Ge2)x(GaAs)1−x graded gap layers were grown using the method of liquid phase epitaxy on GaAs substrates. Investigated are distributions of chemical components along the thickness of the epitaxial layer. In accord to the scan patterns obtained in characteristic X-rays, the layers have a perfect structure, and the component distributions both along the thickness and the interface are rather monotonous, macroscopic defects and metal inclusions are absent. In the epitaxial layers, we created p-n junctions by diffusion of Zn from a gas phase. We studied the possibilities of using the GaAs- (Ge2)x(GaAs)1−x structures as solar converters including the near infra-red region. In this case, the GaAs substrate serves as a filter for light quanta with the energy hν < EgGaAs. The conversion efficiency dependences on the gradient x and the p-n junction position inside the (Ge2)x(GaAs)1−x graded gap layer are also shown. Keywords: liquid phase epitaxy, solid solution, p-n junction. Manuscript received 15.07.05; accepted for publication 25.10.05. Multilayer cascade solar cells are one of the promising cells of modern photoenergetics due to their high efficiencies. Current investigations on the subject are directed to increasing the spectral range of sensitivity and to finding the most suitable cascade elements. The majority of authors [1, 2] used Ge as a bottom element of the cascade, which results in widening the spectral sensitivity to long-wave side of the solar radiation. In the works [1, 2], the solid solutions were prepared by the gas and molecular beam epitaxy methods. In this paper, we report on the solid solutions made up by the liquid phase epitaxy and the investigations of dependences of the main output parameters of (Ge2)x(GaAs)1−x cascade solar cells on the variability of the bandgap width. We constructed the graded gap structures p-(Ge2)x(GaAs)1−x – n-(Ge2)x(GaAs)1−x – n-GaAs, where x varies from 0 to 1 (Fig. 1). The structure was grown by the 1iquid phase epitaxy method in an isolated cassette from confined volume of bismuth solutions in the pure hydrogen flow with the dew point of 213 to 218 K, which was controlled. 〈111〉 oriented n-GaAs plates with the dia- meter of 20 mm, thickness of 350 to 400 μm were used as substrates with pure Bi solvents. The p-n junction was formed during the crystal growth of the autodoping p-type layers and by diffusion of Zn from a gas phase. To define the optimal position d of the p-n junction in the graded gap of (Ge2)x(GaAs)1−x solid solutions, we studied the dependence of short circuit current Jsc, open circuit voltage Voc, spectral sensitivity and efficiency η on the ratio of d to the net thickness of the variable gap solution w. For this aim, several samples were prepared with different positions of p-n junction in the layer. The gap width of the layer was varied between 0.6 < Eg < 1.43 eV. Consequently, the peak of photo- sensitivity (Fig. 2), short circuit current, and efficiency were different for these layers. In Fig. 3, the dependence of output power of the samples on the parameter d is given. It increases with the displacement of the p-n junction to the low bandgap region. The power increase is not so high as was expected. Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 4. P. 33-34. © 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine 34 Fig. 2. Spectral characteristics of the solar cells based on solid solution (Ge2)x(GaAs)1−x with various p-n junction positions d: 1 – 12…13, 2 − 7…8, 3 − 3…4 μm. Fig. 3. Dependence of the output power for the solar cells (Ge2)x(GaAs)1−x on the p-n junction position. Values of d are the same as in Fig. 2. Fig. 4. Open circuit voltage as a function of the p-n junction position, d. Values of d are the same as in Fig. 2. Fig. 5. Short circuit current of the variable gap (Ge2)x(GaAs)1-x solar cells as a function of the relative p-n junction position d/w. Values of d are the same as in Fig. 2. Dependences of Jsc and Voc on d/w are presented in Figs 4 and 5, respectively. The analysis show that the short current increases from 3…4 to 15…17 mA/cm2 and open circuit voltage from 0.67…0.72 to 0.21…0.25 V with increasing d. Then the maximum efficiency value can be obtained for d between 3 and 4 µm, which corresponds to d/w between 0.23 and 0.26. The solar cell performance considered (Figs 4 and 5) depends on the area only quantitatively and not qualitatively. The increase of Jsc with increasing d at its low values can be explained as a decrease in the open circuit voltage and efficiency. As it follows from Fig. 5, the open circuit voltage decreases linearly with increasing the thickness of the variable gap semiconductor. Values of d are the same as in Fig. 2. Our results have demonstrated that the variable gap solid solutions (Ge2)x(GaAs)1−x can be succesfully used for cascade solar cells as bottom elements. By varying the thickness of the graded gap layer and by creating the solar cells with an upper wide gap window on the opposite of substrate, the efficiency of cascade cells can be increased significantly. The main problem in the technology of designing the cascade cells is balancing the short circuit current of cascade elements. The construction proposed in the paper simplifies the problem significantly and can be utilized successfully in further developments of the similar cascade solar cells. It is known that the cascade GaAs-Ge solar cells must be spectral sensitive in the wide wavelength region from 0.4 up to 1.7 µm of solar radiation. The values of the photogenerated current in GaAs and Ge cells allow to obtain high photovoltages with minimum losses even at their series connection. The obtained results show that the investigated cascade cells are effective and repro- ducible as compared with the currently available data. References 1. L.D. Partain, M.S. Kurula, R.E. Wiess et al., 26.1 % solar cell efficiency for Ge mechanically stacked under GaAs // J. Appl. Phys. 62, N 7, p. 3010-3015 (1987). 2. J.N. Bullock, C.H. Wu, J.F. Wise, Interface contribution to GaAs/Ge heterojunction solar cell efficiency // IEEE Trans. Electr. Devices 36, N 7, p. 1238-1243 (1989).