Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films

We have modified the Landau-Khalatnikov approach and shown that the pyroelectric response of inhomogeneous ferroelectric-semiconductor films can be described using six coupled equations for six order parameters: average displacement, its mean-square fluctuation and correlation with charge defect den...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2006
Main Authors: Morozovska, A.N., Eliseev, E.A., Remiens, D., Soyer, C.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2006
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121582
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films / A.N. Morozovska, E.A. Eliseev, D. Remiens, C. Soyer // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 8, № 1. — С. 14-21. — Бібліогр.: 31 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121582
record_format dspace
spelling Morozovska, A.N.
Eliseev, E.A.
Remiens, D.
Soyer, C.
2017-06-14T17:13:38Z
2017-06-14T17:13:38Z
2006
Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films / A.N. Morozovska, E.A. Eliseev, D. Remiens, C. Soyer // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 8, № 1. — С. 14-21. — Бібліогр.: 31 назв. — англ.
1560-8034
PACS 77.80.-e, 77.80.Dj, 61.43.-j
https://nasplib.isofts.kiev.ua/handle/123456789/121582
We have modified the Landau-Khalatnikov approach and shown that the pyroelectric response of inhomogeneous ferroelectric-semiconductor films can be described using six coupled equations for six order parameters: average displacement, its mean-square fluctuation and correlation with charge defect density fluctuations, average pyroelectric coefficient, its fluctuation and correlation with charge defect density fluctuations. Coupled equations demonstrate the inhomogeneous reversal of pyroelectric response in contrast to the equations of the Landau-Khalatnikov type, which describe the homogeneous reversal with the sharp pyroelectric coefficient peak near the thermodynamic coercive field value. Within the framework of our model, the pyroelectric hysteresis loop becomes much smoother, thinner and lower as well as the pyroelectric coefficient peaks near the coercive field completely disappear with increase in disordering caused by defects. This effect is similar to the well-known "square to slim transition" of the ferroelectric hysteresis loops in relaxor ferroelectrics. Also the increase of defect concentration leads to the drastic decrease of the coercive field typical for disordered ferroelectrics. Usually pyroelectric hysteresis loops of doped and inhomogeneous ferroelectrics have typical smooth shape without any pyroelectric coefficient peaks, and the coercive field values much lower than the thermodynamic one. Therefore, our approach qualitatively explains available experimental results. A rather well quantitative agreement between our modelling and typical Pb(Zr,Ti)O₃ film pyroelectric and ferroelectric loops has been obtained.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
spellingShingle Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
Morozovska, A.N.
Eliseev, E.A.
Remiens, D.
Soyer, C.
title_short Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
title_full Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
title_fullStr Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
title_full_unstemmed Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
title_sort modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films
author Morozovska, A.N.
Eliseev, E.A.
Remiens, D.
Soyer, C.
author_facet Morozovska, A.N.
Eliseev, E.A.
Remiens, D.
Soyer, C.
publishDate 2006
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description We have modified the Landau-Khalatnikov approach and shown that the pyroelectric response of inhomogeneous ferroelectric-semiconductor films can be described using six coupled equations for six order parameters: average displacement, its mean-square fluctuation and correlation with charge defect density fluctuations, average pyroelectric coefficient, its fluctuation and correlation with charge defect density fluctuations. Coupled equations demonstrate the inhomogeneous reversal of pyroelectric response in contrast to the equations of the Landau-Khalatnikov type, which describe the homogeneous reversal with the sharp pyroelectric coefficient peak near the thermodynamic coercive field value. Within the framework of our model, the pyroelectric hysteresis loop becomes much smoother, thinner and lower as well as the pyroelectric coefficient peaks near the coercive field completely disappear with increase in disordering caused by defects. This effect is similar to the well-known "square to slim transition" of the ferroelectric hysteresis loops in relaxor ferroelectrics. Also the increase of defect concentration leads to the drastic decrease of the coercive field typical for disordered ferroelectrics. Usually pyroelectric hysteresis loops of doped and inhomogeneous ferroelectrics have typical smooth shape without any pyroelectric coefficient peaks, and the coercive field values much lower than the thermodynamic one. Therefore, our approach qualitatively explains available experimental results. A rather well quantitative agreement between our modelling and typical Pb(Zr,Ti)O₃ film pyroelectric and ferroelectric loops has been obtained.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121582
citation_txt Modelling of pyroelectric response in inhomogeneous ferroelectric-semiconductor films / A.N. Morozovska, E.A. Eliseev, D. Remiens, C. Soyer // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 8, № 1. — С. 14-21. — Бібліогр.: 31 назв. — англ.
work_keys_str_mv AT morozovskaan modellingofpyroelectricresponseininhomogeneousferroelectricsemiconductorfilms
AT eliseevea modellingofpyroelectricresponseininhomogeneousferroelectricsemiconductorfilms
AT remiensd modellingofpyroelectricresponseininhomogeneousferroelectricsemiconductorfilms
AT soyerc modellingofpyroelectricresponseininhomogeneousferroelectricsemiconductorfilms
first_indexed 2025-12-07T19:57:55Z
last_indexed 2025-12-07T19:57:55Z
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