Compositional studies of optical parameters in (Ag₃AsS₃)x(As₂S₃)₁₋x (x = 0.3; 0.6; 0.9) thin films

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2016
• Hauptverfasser: Studenyak, I.P., Kranjčec, M., Kutsyk, M.M., Pal, Yu.O., Neimet, Yu.Yu., Izai, V.Yu., Makauz, I.I., Cserhati, C., Kökényesi, S.
• Format: Artikel
• Sprache: English
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/121658
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Compositional studies of optical parameters in (Ag₃AsS₃)x(As₂S₃)₁₋x (x = 0.3; 0.6; 0.9) thin films / I.P. Studenyak, M. Kranjčec, M.M. Kutsyk, Yu.O. Pal, Yu.Yu. Neimet, V.Yu. Izai, I.I. Makauz, C. Cserhati, S. Kökényesi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 4. — С. 371-376. — Бібліогр.: 20 назв. — англ.

(Ag₃AsS₃)x(As₂S₃)₁₋x (x = 0.3; 0.6; 0.9) thin films were deposited onto a silica substrate by rapid thermal evaporation. The amount of Ag-rich crystalline phase precipitates on the surfaces of the films increases with Ag₃AsS₃ content. It has been shown that the absorption edge spectra are described...