Activation spectroscopy of electronically induced defects in solid Ne

• Published in: Физика низких температур
• Date: 2003
• Main Authors: Grigorashchenko, O.N., Rudenkov, V.V., Khizhnyi, I.V., Savchenko, E.V., Frankowski, M., Smith-Gicklhorn, A.M., Beyer, M.K., Bondybey, V.E.
• Format: Article
• Language: English
• Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2003
• Subjects: Spectroscopy in Cryocrystals and Matrices
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/128944
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Activation spectroscopy of electronically induced defects in solid Ne / O.N. Grigorashchenko, V.V. Rudenkov, I.V. Khizhnyi, E.V. Savchenko, M. Frankowski, A.M. Smith-Gicklhorn, M.K. Beyer, V.E. Bondybey // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1147-1151. — Бібліогр.: 20 назв. — англ.

Thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) methods were used in combination with cathodoluminescence to probe electronically induced defects in solid Ne. The defects were generated by a low energy electron beam. For spectroscopic study we used Ar* ce...