Activation spectroscopy of electronically induced defects in solid Ne
Thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) methods were used in combination with cathodoluminescence to probe electronically induced defects in solid Ne. The defects were generated by a low energy electron beam. For spectroscopic study we used Ar* ce...
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| Published in: | Физика низких температур |
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| Date: | 2003 |
| Main Authors: | , , , , , , , |
| Format: | Article |
| Language: | English |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2003
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/128944 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Activation spectroscopy of electronically induced defects in solid Ne / O.N. Grigorashchenko, V.V. Rudenkov, I.V. Khizhnyi, E.V. Savchenko, M. Frankowski, A.M. Smith-Gicklhorn, M.K. Beyer, V.E. Bondybey // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1147-1151. — Бібліогр.: 20 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862714586778566656 |
|---|---|
| author | Grigorashchenko, O.N. Rudenkov, V.V. Khizhnyi, I.V. Savchenko, E.V. Frankowski, M. Smith-Gicklhorn, A.M. Beyer, M.K. Bondybey, V.E. |
| author_facet | Grigorashchenko, O.N. Rudenkov, V.V. Khizhnyi, I.V. Savchenko, E.V. Frankowski, M. Smith-Gicklhorn, A.M. Beyer, M.K. Bondybey, V.E. |
| citation_txt | Activation spectroscopy of electronically induced defects in solid Ne / O.N. Grigorashchenko, V.V. Rudenkov, I.V. Khizhnyi, E.V. Savchenko, M. Frankowski, A.M. Smith-Gicklhorn, M.K. Beyer, V.E. Bondybey // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1147-1151. — Бібліогр.: 20 назв. — англ. |
| collection | DSpace DC |
| container_title | Физика низких температур |
| description | Thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) methods were used in combination with cathodoluminescence to probe electronically induced defects in solid Ne. The defects were generated by a low energy electron beam. For spectroscopic study we used Ar* centers in Ne matrix as a model system. At a temperature of 10.5 K a sharp decrease in the intensity of "defect" components in the luminescence spectrum was observed. From the analysis of the corresponding peak in the TSL and TSEE yields the trap depth energy was estimated and compared with available theoretical calculations. The obtained data support the model suggested by Song, that stable electronically induced defects have the configuration of second-neighbour Frenkel pairs.
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| first_indexed | 2025-12-07T17:52:33Z |
| format | Article |
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| id | nasplib_isofts_kiev_ua-123456789-128944 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 0132-6414 |
| language | English |
| last_indexed | 2025-12-07T17:52:33Z |
| publishDate | 2003 |
| publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| record_format | dspace |
| spelling | Grigorashchenko, O.N. Rudenkov, V.V. Khizhnyi, I.V. Savchenko, E.V. Frankowski, M. Smith-Gicklhorn, A.M. Beyer, M.K. Bondybey, V.E. 2018-01-14T13:23:56Z 2018-01-14T13:23:56Z 2003 Activation spectroscopy of electronically induced defects in solid Ne / O.N. Grigorashchenko, V.V. Rudenkov, I.V. Khizhnyi, E.V. Savchenko, M. Frankowski, A.M. Smith-Gicklhorn, M.K. Beyer, V.E. Bondybey // Физика низких температур. — 2003. — Т. 29, № 9-10. — С. 1147-1151. — Бібліогр.: 20 назв. — англ. 0132-6414 PACS: 78.60.Kn, 79.75.+g https://nasplib.isofts.kiev.ua/handle/123456789/128944 Thermally stimulated luminescence (TSL) and thermally stimulated exoelectron emission (TSEE) methods were used in combination with cathodoluminescence to probe electronically induced defects in solid Ne. The defects were generated by a low energy electron beam. For spectroscopic study we used Ar* centers in Ne matrix as a model system. At a temperature of 10.5 K a sharp decrease in the intensity of "defect" components in the luminescence spectrum was observed. From the analysis of the corresponding peak in the TSL and TSEE yields the trap depth energy was estimated and compared with available theoretical calculations. The obtained data support the model suggested by Song, that stable electronically induced defects have the configuration of second-neighbour Frenkel pairs. We thank Profs. K.S. Song and G. Zimmerer for valuable discussions. Financial support from the Deutsche Forschungsgemeinschaft through the program «Förderung der wissenschaftlichen Beziehungen deutscher Wissenschaftler zu Wissenschaftlern in Ländern Mittel- und Osteuropas sowie Ländern der vormaligen UdSSR» is gratefully acknowledged. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Spectroscopy in Cryocrystals and Matrices Activation spectroscopy of electronically induced defects in solid Ne Article published earlier |
| spellingShingle | Activation spectroscopy of electronically induced defects in solid Ne Grigorashchenko, O.N. Rudenkov, V.V. Khizhnyi, I.V. Savchenko, E.V. Frankowski, M. Smith-Gicklhorn, A.M. Beyer, M.K. Bondybey, V.E. Spectroscopy in Cryocrystals and Matrices |
| title | Activation spectroscopy of electronically induced defects in solid Ne |
| title_full | Activation spectroscopy of electronically induced defects in solid Ne |
| title_fullStr | Activation spectroscopy of electronically induced defects in solid Ne |
| title_full_unstemmed | Activation spectroscopy of electronically induced defects in solid Ne |
| title_short | Activation spectroscopy of electronically induced defects in solid Ne |
| title_sort | activation spectroscopy of electronically induced defects in solid ne |
| topic | Spectroscopy in Cryocrystals and Matrices |
| topic_facet | Spectroscopy in Cryocrystals and Matrices |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/128944 |
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