Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings

• Опубліковано в: Физика низких температур
• Дата: 2016
• ISSN: 0132-6414
• Автори: Spevak, I.S., Kuzmenko, A.A., Tymchenko, M., Gavrikov, V.K., Shulga, V.M., Feng, J., Sun, H.B., Kamenev, Yu.E., Kats, A.V.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2016
• Теми: К 75-летию открытия теплового сопротивления Капицы
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/129275
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings / I.S. Spevak, A.A. Kuzmenko, M. Tymchenko, V.K. Gavrikov, V.M. Shulga, J. Feng, H.B. Sun, Yu.E. Kamenev, A.V. Kats // Физика низких температур. — 2016. — Т. 42, № 8. — С. 887-891. — Бібліогр.: 29 назв. — англ.

Resonance diffraction of THz hidrogen cyanide laser radiation on a semiconductor (InSb) grating is studied both
 experimentally and theoretically. The specular reflectivity suppression due to the resonance excitation of the THz
 surface plasmon-polariton is observed on a pure semiconductor grating and on semiconductor gratings covered with
 a thin dielectric layer. The dielectric coating of the grating results in the resonance shift and widening depending
 both on the layer thickness and dielectric properties. A simple analytical theory of the resonance diffraction on rather
 shallow gratings covered with a dielectric layer is presented, and the results are in a good accordance with the
 experimental data. Analytical expressions for the resonance shift and broadening are essential for the resonance
 properties understanding and useful for sensing data interpretation of the agents deposited on the grating surface.