Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings
Resonance diffraction of THz hidrogen cyanide laser radiation on a semiconductor (InSb) grating is studied both
 experimentally and theoretically. The specular reflectivity suppression due to the resonance excitation of the THz
 surface plasmon-polariton is observed on a pure semicon...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 2016 |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2016
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| Zitieren: | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings / I.S. Spevak, A.A. Kuzmenko, M. Tymchenko, V.K. Gavrikov, V.M. Shulga, J. Feng, H.B. Sun, Yu.E. Kamenev, A.V. Kats // Физика низких температур. — 2016. — Т. 42, № 8. — С. 887-891. — Бібліогр.: 29 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862639419913142272 |
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| author | Spevak, I.S. Kuzmenko, A.A. Tymchenko, M. Gavrikov, V.K. Shulga, V.M. Feng, J. Sun, H.B. Kamenev, Yu.E. Kats, A.V. |
| author_facet | Spevak, I.S. Kuzmenko, A.A. Tymchenko, M. Gavrikov, V.K. Shulga, V.M. Feng, J. Sun, H.B. Kamenev, Yu.E. Kats, A.V. |
| citation_txt | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings / I.S. Spevak, A.A. Kuzmenko, M. Tymchenko, V.K. Gavrikov, V.M. Shulga, J. Feng, H.B. Sun, Yu.E. Kamenev, A.V. Kats // Физика низких температур. — 2016. — Т. 42, № 8. — С. 887-891. — Бібліогр.: 29 назв. — англ. |
| collection | DSpace DC |
| container_title | Физика низких температур |
| description | Resonance diffraction of THz hidrogen cyanide laser radiation on a semiconductor (InSb) grating is studied both
experimentally and theoretically. The specular reflectivity suppression due to the resonance excitation of the THz
surface plasmon-polariton is observed on a pure semiconductor grating and on semiconductor gratings covered with
a thin dielectric layer. The dielectric coating of the grating results in the resonance shift and widening depending
both on the layer thickness and dielectric properties. A simple analytical theory of the resonance diffraction on rather
shallow gratings covered with a dielectric layer is presented, and the results are in a good accordance with the
experimental data. Analytical expressions for the resonance shift and broadening are essential for the resonance
properties understanding and useful for sensing data interpretation of the agents deposited on the grating surface.
|
| first_indexed | 2025-12-01T01:13:33Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-129275 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 0132-6414 |
| language | English |
| last_indexed | 2025-12-01T01:13:33Z |
| publishDate | 2016 |
| publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| record_format | dspace |
| spelling | Spevak, I.S. Kuzmenko, A.A. Tymchenko, M. Gavrikov, V.K. Shulga, V.M. Feng, J. Sun, H.B. Kamenev, Yu.E. Kats, A.V. 2018-01-18T17:06:02Z 2018-01-18T17:06:02Z 2016 Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings / I.S. Spevak, A.A. Kuzmenko, M. Tymchenko, V.K. Gavrikov, V.M. Shulga, J. Feng, H.B. Sun, Yu.E. Kamenev, A.V. Kats // Физика низких температур. — 2016. — Т. 42, № 8. — С. 887-891. — Бібліогр.: 29 назв. — англ. 0132-6414 PACS: 42.25.Fx https://nasplib.isofts.kiev.ua/handle/123456789/129275 Resonance diffraction of THz hidrogen cyanide laser radiation on a semiconductor (InSb) grating is studied both
 experimentally and theoretically. The specular reflectivity suppression due to the resonance excitation of the THz
 surface plasmon-polariton is observed on a pure semiconductor grating and on semiconductor gratings covered with
 a thin dielectric layer. The dielectric coating of the grating results in the resonance shift and widening depending
 both on the layer thickness and dielectric properties. A simple analytical theory of the resonance diffraction on rather
 shallow gratings covered with a dielectric layer is presented, and the results are in a good accordance with the
 experimental data. Analytical expressions for the resonance shift and broadening are essential for the resonance
 properties understanding and useful for sensing data interpretation of the agents deposited on the grating surface. This work was supported by the Ukrainian State program
 “Nanotechnologies and nanomaterials”, and by the
 program of the National Academy of Sciences of Ukraine
 “Fundamental problems of nanostructured systems, nanomaterials
 and nanotechnologies”. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур К 75-летию открытия теплового сопротивления Капицы Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings Article published earlier |
| spellingShingle | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings Spevak, I.S. Kuzmenko, A.A. Tymchenko, M. Gavrikov, V.K. Shulga, V.M. Feng, J. Sun, H.B. Kamenev, Yu.E. Kats, A.V. К 75-летию открытия теплового сопротивления Капицы |
| title | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings |
| title_full | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings |
| title_fullStr | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings |
| title_full_unstemmed | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings |
| title_short | Surface plasmon-polariton resonance at diffraction of THz radiation on semiconductor gratings |
| title_sort | surface plasmon-polariton resonance at diffraction of thz radiation on semiconductor gratings |
| topic | К 75-летию открытия теплового сопротивления Капицы |
| topic_facet | К 75-летию открытия теплового сопротивления Капицы |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/129275 |
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