Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation

On the basis of the Wagner approach in the theory of thermal breakdown of dielectrics, the analogous phenomenon in semiconductor films is analyzed. It is done without account of the stabilization effect connected with an external resistance. Formulas giving values of the fused channel diameters and...

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Published in:Functional Materials
Date:2005
Main Authors: Andreyeva, N.V., Virchenko, Yu.P.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2005
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/134780
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation / N.V. Andreyeva, Yu.P. Virchenko // Functional Materials. — 2005. — Т. 12, № 2. — С. 190-195. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-134780
record_format dspace
spelling Andreyeva, N.V.
Virchenko, Yu.P.
2018-06-14T08:43:40Z
2018-06-14T08:43:40Z
2005
Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation / N.V. Andreyeva, Yu.P. Virchenko // Functional Materials. — 2005. — Т. 12, № 2. — С. 190-195. — англ.
1027-5495
https://nasplib.isofts.kiev.ua/handle/123456789/134780
On the basis of the Wagner approach in the theory of thermal breakdown of dielectrics, the analogous phenomenon in semiconductor films is analyzed. It is done without account of the stabilization effect connected with an external resistance. Formulas giving values of the fused channel diameters and the breakdown time are obtained.
На основе подхода Вагнера в теории теплового пробоя диэлектриков проанализировано явление теплового пробоя полупроводниковой пленки без учета эффекта стабилизации внешним сопротивлением. Получены формулы для диаметров проплавленных каналов и времени пробоя.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
spellingShingle Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
Andreyeva, N.V.
Virchenko, Yu.P.
title_short Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
title_full Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
title_fullStr Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
title_full_unstemmed Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
title_sort analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation
author Andreyeva, N.V.
Virchenko, Yu.P.
author_facet Andreyeva, N.V.
Virchenko, Yu.P.
publishDate 2005
language English
container_title Functional Materials
publisher НТК «Інститут монокристалів» НАН України
format Article
description On the basis of the Wagner approach in the theory of thermal breakdown of dielectrics, the analogous phenomenon in semiconductor films is analyzed. It is done without account of the stabilization effect connected with an external resistance. Formulas giving values of the fused channel diameters and the breakdown time are obtained. На основе подхода Вагнера в теории теплового пробоя диэлектриков проанализировано явление теплового пробоя полупроводниковой пленки без учета эффекта стабилизации внешним сопротивлением. Получены формулы для диаметров проплавленных каналов и времени пробоя.
issn 1027-5495
url https://nasplib.isofts.kiev.ua/handle/123456789/134780
citation_txt Analysis of the secondary breakdown of semiconductor materials on the basis of the nonlinear thermal conductivity equation / N.V. Andreyeva, Yu.P. Virchenko // Functional Materials. — 2005. — Т. 12, № 2. — С. 190-195. — англ.
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AT virchenkoyup analysisofthesecondarybreakdownofsemiconductormaterialsonthebasisofthenonlinearthermalconductivityequation
first_indexed 2025-12-07T15:29:30Z
last_indexed 2025-12-07T15:29:30Z
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