Laser ablation and photostimulated passivation of Cd₁₋ₓZnₓTe crystals

Proposed is a new technology of passivation of Cd₁₋ₓZnₓTe crystals which comprises preliminary treatment of their surface by laser ablation aimed at removal of the disturbed surface-adjacent layer arising due to mechanical treatment (cutting, grinding, polishing) of the samples. Degradation of the s...

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Datum:2012
Hauptverfasser: Zagoruiko, Yu.A., Fedorenko, O.A., Khristyan, V.A., Kovalenko, N.O., Mateychenko, P.V., Dobrotvorskaya, M.V., Poluboyarov, A.A.
Format: Artikel
Sprache:English
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2012
Schriftenreihe:Functional Materials
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/135323
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Laser ablation and photostimulated passivation of Cd₁₋ₓZnₓTe crystals / Yu.A. Zagoruiko, O.A. Fedorenko, V.A. Khristyan, N.O. Kovalenko, P.V. Mateychenko, M.V. Dobrotvorskaya, A.A. Poluboyarov // Functional Materials. — 2012. — Т. 19, № 3. — С. 385-389. — Бібліогр.: 20 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:Proposed is a new technology of passivation of Cd₁₋ₓZnₓTe crystals which comprises preliminary treatment of their surface by laser ablation aimed at removal of the disturbed surface-adjacent layer arising due to mechanical treatment (cutting, grinding, polishing) of the samples. Degradation of the spectrometric characteristics of the detectors after chemical etching is compared with their degradation caused by the proposed passivation method.