Optical properties of Ge-As-S thin films

Thin Ge-As-S films have been prepared by thermal vacuum evaporation. Optical parameters and thickness values of the films have been calculated basing on transmission spectra. The dispersion dependences of the refractive index have been shown to be described well by the single oscillator model. The o...

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Bibliographic Details
Date:2009
Main Authors: Tolmachov, I.D., Stronski, A.V.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2009
Series:Functional Materials
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/136625
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Optical properties of Ge-As-S thin films // I.D. Tolmachov, A.V. Stronski // Functional Materials. — 2009. — Т. 16, № 1. — С. 32-35. — Бібліогр.: 6 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine