Scanning Acoustic Microscopy of Annealing Effects for Aluminium Thin Film Deposited on Silicon Substrate
Scanning acoustic microscope (SAM) has proved to be a powerful new technique for investigation and characterization of mechanical properties of materials, especially, the opaque ones. Non-destructive measurements can be carried out using SAM in the vicinity of materials’ surfaces or relatively deepe...
Saved in:
| Published in: | Металлофизика и новейшие технологии |
|---|---|
| Date: | 2018 |
| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
Інститут металофізики ім. Г.В. Курдюмова НАН України
2018
|
| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/151871 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Scanning Acoustic Microscopy of Annealing Effects for Aluminium Thin Film Deposited on Silicon Substrate / Chafia Atailia, Lakhdar Deboub, Amar Boudour, Youcef Boumaiza // Металлофизика и новейшие технологии. — 2018. — Т. 40, № 10. — С. 1387-1399. — Бібліогр.: 20 назв. — англ. |