Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon
The review article deals with ‘quantum engineering’ of growing of silver films on semiconductor substrates that allows obtaining new forms of matter. The results on the energy dispersion of electron states in epitaxial Ag (111) films obtained on Si (001) and Si (111) are presented.
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Інститут металофізики ім. Г.В. Курдюмова НАН України
2019
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| Цитувати: | Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon / L.I. Karbivska, V.L. Karbivskyy, A.O. Romanskyy // Progress in Physics of Metals. — 2019. — Vol. 20, No 3. — P. 502-532. — Bibliog.: 61 titles. — eng. |
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nasplib_isofts_kiev_ua-123456789-1679352025-02-09T15:23:39Z Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon Детермінізм симетрії монокристалічної поверхні межі поділу при одержанні 0D- і 2D-структур шляхетних металів та Індію на кремнії Детерминизм симметрии монокристаллической поверхности границы раздела при получении 0D-и 2D-структур благородных металлов и индия на кремнии Karbivska, L.I. Karbivskyy, V.L. Romanskyy, A.O. The review article deals with ‘quantum engineering’ of growing of silver films on semiconductor substrates that allows obtaining new forms of matter. The results on the energy dispersion of electron states in epitaxial Ag (111) films obtained on Si (001) and Si (111) are presented. Оглядову статтю присвячено «квантовій інженерії» вирощування плівок срібла на напівпровідникових підкладинках, яке уможливлює одержання нових форм речовини. Наведено результати з енергетичної дисперсії електронних станів у епітаксіальних плівках Ag (111), одержаних на Si (001) та Si (111). Обзорная статья посвящена «квантовой инженерии» выращивания пл нок серебра на полупроводниковых подложках, которое позволяет получать новые формы вещества. Приведены результаты по энергетической дисперсии электронных состояний в эпитаксиальных пл нках Ag (111), полученных на Si (001) и Si (111). 2019 Article Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon / L.I. Karbivska, V.L. Karbivskyy, A.O. Romanskyy // Progress in Physics of Metals. — 2019. — Vol. 20, No 3. — P. 502-532. — Bibliog.: 61 titles. — eng. 1608-1021 DOI: https: //doi.org/10.15407/ufm.20.03.502 https://nasplib.isofts.kiev.ua/handle/123456789/167935 en Успехи физики металлов application/pdf Інститут металофізики ім. Г.В. Курдюмова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The review article deals with ‘quantum engineering’ of growing of silver films on semiconductor substrates that allows obtaining new forms of matter. The results on the energy dispersion of electron states in epitaxial Ag (111) films obtained on Si (001) and Si (111) are presented. |
| format |
Article |
| author |
Karbivska, L.I. Karbivskyy, V.L. Romanskyy, A.O. |
| spellingShingle |
Karbivska, L.I. Karbivskyy, V.L. Romanskyy, A.O. Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon Успехи физики металлов |
| author_facet |
Karbivska, L.I. Karbivskyy, V.L. Romanskyy, A.O. |
| author_sort |
Karbivska, L.I. |
| title |
Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon |
| title_short |
Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon |
| title_full |
Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon |
| title_fullStr |
Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon |
| title_full_unstemmed |
Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon |
| title_sort |
determinism of the symmetry of a single-crystalline surface of interface at obtaining 0d- and 2d-structues of noble metals and indium on silicon |
| publisher |
Інститут металофізики ім. Г.В. Курдюмова НАН України |
| publishDate |
2019 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/167935 |
| citation_txt |
Determinism of the symmetry of a single-crystalline surface of interface at obtaining 0D- and 2D-structues of noble metals and indium on silicon / L.I. Karbivska, V.L. Karbivskyy, A.O. Romanskyy // Progress in Physics of Metals. — 2019. — Vol. 20, No 3. — P. 502-532. — Bibliog.: 61 titles. — eng. |
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Успехи физики металлов |
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502 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
© L.I. KARBIVSKA, V.L. KARBIVSKYY, A.O. ROMANSKYY, 2019
https://doi.org/10.15407/ufm.20.03.502
L.I. KARBIVSKA, V.L. KARBIVSKYY, and A.O. ROMANSKYY
G.V. Kurdyumov Institute for Metal Physics, NAS of Ukraine,
36 Academician Vernadsky Blvd., UA-03142 Kyiv, Ukraine
DETERMINISM OF THE SYMMETRY
OF A SINGLE-CRYSTALLINE SURFACE
OF INTERFACE AT OBTAINING
0D -AND 2D -STRUCTUES OF NOBLE
METALS AND INDIUM ON SILICON
The review article deals with ‘quantum engineering’ of growing of silver films on
semiconductor substrates that allows obtaining new forms of matter. The results
on the energy dispersion of electron states in epitaxial Ag (111) films obtained on
Si (001) and Si (111) are presented. The splitting of bands is explained, and analysis
of the Shockley’s surface states is given. Superstructures, which are formed on the
surface of monolayer silver nanostructures, are analysed in detail. A detailed analy-
sis of the energy states of the noble-metal quantum wells is given. The mechanism
of formation of a noble-metal nanorelief on the (111) and (110) surfaces of Si single
crystal during multistage thermal deposition is investigated. The symmetry of the
interface surface of the single-crystal Si (111) 7 × 7 silicon plane is deterministic in
the growth mechanism of the hexagonal-pyramidal structures of copper, silver, and
gold. The morphological features of the indium surface during its thermal deposi-
tion on the Si (111) and Si (110) surfaces are investigated. The formation of clusters
of a regular cubic shape is observed that indicates the formation of In nanocrystals.
The formation of In nanoclusters (of ≈10 nm size) on the Si (111) surface and the
subsequent modification of the single-crystal surface morphology response in the
calculated curves of electron density of states.
Keywords: quantum wells, energy dispersion, noble metals, surface, morphology,
scanning tunnelling microscopy, thermal deposition.
1. Introduction
For specialists involved in the study of the growth processes of thin
films and the study of the surfaces of materials, the fabrication of me-
tallic nanostructures on the atomic-clean surfaces of semiconductor sin-
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 503
Determinism of the Symmetry of a Single-Crystalline Surface
gle crystals is one of the most important areas of research. Among
other things, it is so because in many electronic devices the metal-semi-
conductor boundary section is a working component. Many years of in-
tensive research in this direction eloquently prove its importance. Nev-
ertheless, despite that, fundamental research in this area is still
interesting and relevant. This topic still attracts a lot of attention, in-
cluding due to a number of interesting effects associated primarily with
preparation technology and size effects.
It is known that the growth modes (regimes) of substances on differ-
ent substrates can be described by three main types [1]: two-dimensional
(2D) mode or layer-by-layer growth (Frank–van der Merve growth mode);
combined growth mode, which begins as layer-by-layer growth but then
proceeds to three-dimensional island growth (Stranski–Krastanov growth
mode); three-dimensional island film growth (Volmer–Weber growth
mode). When we vary thermodynamic parameters based on the analysis
of boundary energy and surface energy, these three growth modes may
have differences [2]. The growth of metals on surfaces of semiconductors
has heteroepitaxial character. For a long time, it was thought that the
growth of metals on semiconductor surfaces obeys the aforementioned
growth regimes. However, in 1996, a new approach was published [3].
This approach was based on the critical film thickness during the growth
of silver on the GaAs(110) substrate surface. In the aforementioned
work, it was shown that with a less critical film thickness, they are un-
even, and with increasing thickness, they grow into a smooth, even layer.
A new method for growing thin films was proposed when Smith et al. [3]
applied the two-step method described earlier by Evans et al. [4] for
growing silver on the surface of GaAs (110) at ≈135 K and further an-
nealing at room temperatures. It was discovered that the initially uneven
Ag film consisting of nanoscale 3D clusters self-organizes into an atom-
ically flat film, when the system is warmed to room temperature. More-
over, such a transition from cluster organization of the surface to an
atomically smooth one can take place only when the total number of lay-
ers is no less than six monolayers (ML) [3].
Due to the study of nature of this new type of critical thickness of
growth, the ‘electronic growth’ model was proposed [5]. Electrons in thin
films are quantized along the direction of the surface normal and some
of these electrons can be scattered at the interface of film substrate.
Consequently, as the thickness changes, there will be a change in the
electron energy, which includes oscillations of electrons along the nor-
mal direction to the surface and electrostatic potential due to the ap-
pearance of an electrical double layer with scattered electrons at the
interface. The balance between these phenomena determines the thick-
ness at which the total electron energy has a local minimum [5]. Thus,
the film tends to align and acquires an atomically flat morphology.
504 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
The study of Cu, Ag, and Au nanostructures formation during their
thermal deposition on semiconductor single-crystal surfaces provides a
valuable information about organization of metallic nanostructures, in
par ticular, metallic single-component ones. In view of that, it is very im-
portant from a fundamental point of view. On the other hand, given the
applications in electronics for example, they are no less important from a
purely practical side. Nowadays, noble metal nanostructures are used in
various consumer technologies that use their physical properties, particu-
larly optical, electrically conductive, antibacterial, and others [6–10].
This paper focuses on an overview of the study of the electronic,
spectral, morphological, and structural properties of monolayer films of
noble metals on the surfaces of single crystals.
2. Energy Dispersion in Ag (111) Epitaxial Films
Obtained on Si (001) and Si (111)
The authors of Ref. [11] investigated the dispersion of the quantum-
well states (QWS) in Ag (111) epitaxial films grown on Si (001) and on
Si (111). The studies were carried out via photoelectron spectroscopy
with angular resolution (ARPES). It was found that the planar band
structure of a thin Ag film is essentially determined by the interface of
the substrate (Fig. 1).
The s and p valence electrons of silver in the film are spatially lim-
ited and quantized along the normal to the Ag (111) film. For a bulk
metal, the Ag (111) E(k║) is isotropic, but the size of the dispersion be-
comes significant, if 4d states participate in the hybridization with an
increase of the binding energy [13, 14]. As established by Müller et al.
[12], in-plane effective mass m*
║ increases with binding energy Ebind (the
solid line in Fig. 1). Such a tendency of the s–p band m*
║ of bulk Ag is
explained by the electron states of quantum wells in the Ag/Cu (111)
system [12]. However, this trend does not correspond to the ARPES
data for QWS in Ag/Si (001) and Ag/Si (111), which show completely
opposite aspirations of m*
║ with respect to the binding energy.
The change in plane dispersion can be caused by transverse deforma-
tion of film, which is caused by the lattice mismatch of the interface
and the film [15]. This deformation effect was theoretically calculated
and, as it turned out, it is quite insignificant, and, if there is one, it is
homogeneous in the entire energy range. However, this does not explain
the results for the QWS in Ag/Si (001) and Ag/Si (111), which are sig-
nificantly different from bulk Ag. Herewith, the possibility that the
lattice deformation changes m*
║ cannot be ruled out, thus, affecting the
hybridization of the Ag 4d and s, p valence states.
Another factor that was considered in explaining the anomalous
plane band dispersion was the small size of the planar coherent region.
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 505
Determinism of the Symmetry of a Single-Crystalline Surface
Although this effect of transverse size of film is unlikely, since the
Ag (111) film had an area size of less than 200 Å, which was observed
with scanning tunnelling microscopy (STM) and low-energy electron dif-
fraction (LEED) [16–19], which goes far beyond the quantum limit
<50 Å [20].
During the photoelectron investigation of deposited Ag layers on
the V(100) surface, Valla et al. [21] observed a large discrepancy be-
tween the Ag s–p planar band dispersion and the behaviour of free elec-
trons. From the similarity between such an unexpected dispersion of the
QWS and that on the V (100) substrate with the 3d band, Valla et al. [21]
suggested a strong hybridization between these two electronic states.
Such hybridization with electron states of the substrate can cause unu-
sual dispersions of QWS observed in Ag/Si (001) and Ag/Si (111).
Shaded areas in Fig. 1 correspond to the valence region of the sili-
con substrate below the maximum of the valence band. When QWS are
located within this energy range, they can hybridize with the electron
states of the substrate. Apparently, this unusual behaviour of m*
║ in Ag/
Si (001) and Ag/Si (111) occurs inside such regions. Note also that the
masses m*
║ for Ag/Si (001) and Ag/Si (111) differ little, when the corre-
sponding QWS are located outside the region of the substrate: the QWS
with n = 1 in Ag/Si (001) has m*
║ = 0.3me at Ebind = 0.5 eV (Fig. 1). It is
assumed that the wave functions of the electrons of the Ag (111) s–p
band and the Si (001) s–p band do not hybridize with each other. It is
also not entirely clear how hybridization can affect a planar band dis-
persion of film with a thickness of 14–16 ML with shielding values in-
side the metal [22, 23]. A correct theoretical description with necessity
required knowledge of the band structure of Ag films on monocrystal-
line silicon substrates.
Another unusual aspect of the planar dispersion of QWS is the fact
that the QWS with n = 2 in Ag/Si (001) splits into two subbands with
significant dispersion (Fig. 2). Such a splitting is less likely to occur
Fig. 1. Ratios of (topo-
logical) effective mass
(m*
║) to the free electron
mass (m0) as a function
of the binding energy of
the QWS at k║ = 0 for
Ag (111) film on Cu (111)
[12], Si (111), and Si (001)
substrates. The data
were obtained at hν =
= 22.7, 10.3, and 9.3 eV,
respectively (–, ●, ■, ♦)
506 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
with large quantum numbers, e.g., n = 3. Analysing the splitted bands,
it is necessary to analyse in detail the possibility of the influence of
photoemission from the surface of the substrate itself. The STM and
electron diffraction results [17, 18] show that Ag (111) films uniformly
cover the substrate surface, while the mean free path for the corre-
sponding photoelectrons is no more than ≈10 Å [24], which is about one
third of film thickness Ag (111). It can be assumed that splitting can be
caused due to contributions from different parts of the silver film,
which have different thickness. However, this explanation is also not
plausible, as it was shown that silver films are homogeneous with a
height variation of ±1 or ±2 ML and the expected energy splitting for
such variations in height is much less than the observed one [25, 26].
The parabolic dispersion law should describe the expected dispersion of
the QWS from slightly different film thicknesses. Such splittings were
observed for the Ag (111) films on Si (001) with different thicknesses.
The authors of [11] proposed an explanation of such a splitting of
QWS within the framework of the quantization rule of the phase shift.
It has been established that the difference in the phase shift between
the inner and outer side of the valence band of the substrate corres-
ponds to 0.3 π, which, with using theoretical calculations, gives the dif-
ference between the split Ebind branches for QWS with n = 2 equal to
0.10 ± 0.04 eV. This ratio agrees quite well with the observed energy
splitting at 0.13 ± 0.03 eV for QWS with n = 2 (Fig. 2). Similar calcula-
tions were performed for QWS with n = 3 and 4 in accordance with the
observed energy splittings, e.g., 0.13–0.18 eV for n = 3. These calcula-
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Fig. 3. The same as in the previous figure, but for 16 ML film on Si (111) substrate [11]
Fig. 2. Binding energy Ebind vs. wave vector kǀǀ for 14 ML thick Ag (111) film on
Si (001) substrate along the [101] axis of the substrate (hν = 22.7 eV) [11]
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 507
Determinism of the Symmetry of a Single-Crystalline Surface
tions confirm the idea of a phase break at the substrate edge during
emission not normal. However, such a model is not sufficiently complete
to describe in detail dispersion of the split QWS.
If we apply such theoretical calculations for the Ag/Si(111) system,
the change of the binding energy of QWS near the edge of the bulk Si
band at Ebind ≈ 0.5 eV [QWS with n = 1 in Ag/Si(111)] will be around
0.03 ± 0.03 eV. Such a small value is determined by flattening of the
s–p band of silver close to the top of the band (Fig. 3).
3. Shockley’s Surface States
The Shockley’s surface electron states on silver epitaxial films grown on
a Si (111) 7 × 7 surface were studied in the work of Neuhold et al. [16].
The films were obtained by a two-step method [3]. The LEED method
showed that, before the annealing, only blurred spots were observed,
and after that, distinct hexagons were revealed (Fig. 4).
If we consider a silver layer as a quantum well with valence elec-
trons, the wave vectors of stationary states in the well have the values,
which are described via the equation kz = nπ/Na + C, where a — atomic-
layer width, N — the number of atomic layers in the metal film, n —
principal quantum number. Amendment C occurs due to the finite height
of the walls forming the pit. This value can be found theoretically and
vary very slightly in a certain energy range [27, 28]. Therefore, this
equation describes the quantiza-
tion condition for the k values,
which, due to the monotony of
the band structure, lead to dis-
crete energy levels, first observed
by means of the photoelectron
spectroscopy by Wachs et al. [29].
Figure 4 [30] compares the
spectra of Ag (111)/Si (111) 7 × 7
Fig. 4. Comparison of photoelectron
spectra obtained with excitation photon
energy of 47 eV and emission normal to
≈50 Å thick Ag (111) on the HOPG and
Si (111) 7 × 7. The diagram below shows
the characteristic part of the Ag band
structure near the L point (L'
2 — edge
of the band). The wave vector is taken
as the radius vector of the Brillouin
zone along the Γ–L direction. The in-
sert in the figure shows the LEED of
the Ag (111) film on Si (111) 7 × 7 [30]
508 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
and Ag (111)/HOPG (0001) systems (here, HOPG abbreviates the highly
oriented pyrolytic graphite) obtained by photoelectron spectroscopy at
a temperature of 130 K (the substrate temperature during Ag depo-
sition).
In the band gap along the Γ–L direction (the shaded area below
Fig. 4), there are Shockley’s surface states, which give a peak near the
Fermi energy EF in the Ag/HOPG spectrum in Fig. 4. Its energy is
50 meV below EF at the temperature of 130 K [31]. It is noteworthy that
the peak is absent in the spectrum of the Ag (111)/Si (111) 7 × 7 system
obtained in a similar way. The so-called phase accumulation model was
used to explain the differences in the spectra (Fig. 4). In this model, the
surface states are stationary states in a one-dimensional (1D) quantum
well containing a potential barrier from the vacuum side and a band gap
of the crystal on the other side [32]. Quantum-mechanical solutions are
in the form of phase shifts in the reflection of the wave functions of
electrons from these barriers [27, 28]. It is easy to show that the energy
of the Shockley’s surface state, which is the lowest proper state of this
well, depends on the height of the vacuum barrier, that is, on the work
function [27], and on the energies of the band edges [31]. An experimen-
tal evaluation of the dependence of the energy of surface states on the
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Fig. 5. Photoelectron spectra of Ag films on HOPG (left) and Si (111) (right)
substrates coated with Cs submonolayer. Vertical bars indicate shift of peaks (ħω =
= 47 eV) [27]
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 509
Determinism of the Symmetry of a Single-Crystalline Surface
work-function magnitude was made. The use of the adsorption of the
alkali-metal submonolayer leads to a significant decrease in the work
function. The effect of reducing the work function and its effect on the
experimental spectra of surface states is shown in Fig. 5.
The upper left curve (in Fig. 5) for the Ag (111) surface contains
peaks and significant emission of surface states near EF. As an amount
of precipitated Cs increases, a decrease in the work function is observed.
Such behaviour was previously observed for Cs/Cu (111) and Na/Cu (111)
in Refs. [33, 34]. The decrease of the intensity of the peaks of surface
states with the deposition of Cs occurs due to the redistribution of its
charge in the energy-momentum space [35]. The unperturbed electron
wave function can be detected in a limited region, and when surface
states cross the edge of the L'
2 band at the level of 0.3 eV below EF, their
wave function spreads into the bulk, and the electrons corresponding to
this state will have less sensitivity to surface photoemission.
In order to quantify the shift of the energy of surface states with a
change in the work function, the peaks of the surface states of the quantum
well were modelled using the Voigt peaks described by the Fermi function
with experimentally determined parameters. On the left in Fig. 6, the re-
sults of this analysis for Ag (111) spectra on HOPG are shown by circles.
Given solid line reflects the energies of surface states taken from
the phase accumulation model, in which the effect of adsorption of Cs
is assumed to lead to a change in the work function [27]. One can see
that a simple model describes well the behaviour of surface states.
Fig. 6. Shift of the surface states with changes of the work function and strain. On
the left, the energies of the surface states (from Fig. 5) are compared with the ener-
gies of the phase accumulation model (solid line). On the right, there are calculated
energies of the L'
2 edge of s–p band. The circle marks the point on the theoretical
curve, where the energy of the surface states is shifted by 150 meV relative to the
equilibrium value, as it is the case in Ag (111)/Si (111) 7 × 7 [31]
510 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
In Figure 5 to the right, we can see the results of the effect of Cs
adsorption on the x-ray photoelectron spectra of the 54 Å thick Ag (111)
film obtained on Si (111). The upper curve reflects the spectrum of the
clean surface. Figure 4 shows only the peaks of the quantum well in the
s–p band. No signal from surface states was found in the vicinity of the
Fermi edge. Nevertheless, with a decrease in the work function (Φ) upon
the adsorption of Cs, an increase in the intensity of the peak below EF
occurs. This peak is the most pronounced in the spectrum of the work
function change ΔΦ = −1.31 eV. With a subsequent decrease in the work
function, the intensity of this peak decreases. After its first manifesta-
tion at ΔΦ = −0.74 eV, the energy of its maximum decreases with de-
creasing work function. Thus, the emission from the surface states of
the Ag (111) layers obtained on Si (111) 7 × 7 is due to the shift of the
surface states to the unoccupied region. The downward shift caused by
adsorption of Cs causes an intersection with the Fermi level. The ener-
gies of the surface states obtained from the spectra are shown in Fig. 6.
In order to model the spectra for the clean surface of the Ag (111)/Si
system with a similar restrictive parameter obtained in the case of the
Ag (111)/HOPG system, it is necessary to have a surface state almost
120 meV above EF. The surface states of the Ag (111)/Si (111) 7 × 7 sys-
tem shift, on average, by 150 meV relative to the states in the Ag (111)/
HOPG system. This value is sufficient to empty completely the surface
states of the clean Ag (111) surface at a given temperature [31].
Consequently, several effects can cause a shift in surface states. In
thin epitaxial Ag layers, the surface states of Ag (111) demonstrate sig-
nificant shifts, which are explained in terms of the interaction of the
weakly damped wave function of the surface state in the substrate [36].
The film thickness of about 50 Å, which was used in the work [16], was
much longer than the attenuation length ≈28 Å [37], which makes this
explanation of the above observations impossible.
The lateral localization of the wave function of the surface state on
the tops of the islands, which was considered in Ref. [20], is equally
unlikely, since the island size necessary to obtain a noticeable shift
is much less than the lateral coherence length of LEED. Since the Ag/
Si (111) 7 × 7 interface boundary has significant distinctive parameters
[38], this should lead to the disappearance of LEED. The LEED spots
(Fig. 4) demonstrate that the localization of the surface states of Ag (111)
cannot make a significant contribution to the observed energy shift.
The effect of band edges on the energy of the surface state is a di-
rect explanation of the shift of the surface state in Ag/Si (111) 7 × 7. Due
to its close proximity, the lower band edge (L'
2) has a huge impact.
Therefore, it is reasonable to assume that this quantity determines the
observed shift. This view is supported by the fact that the highest peak
of the quantum well, corresponding to the principal quantum number
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
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Determinism of the Symmetry of a Single-Crystalline Surface
n = N − 1, has a higher energy in Ag/Si (111) than in Ag/HOPG. Since
the number of Ag layers is ca 21 in both cases, this peak should occupy
the same position relative to the edge of the band. This means the ob-
served energy difference indicates a shift in the edge of the L'
2 band.
Nevertheless, variation of the correction coefficient C in equation
kz = nπ/Na + C (see designations above) for Ag films on two substrates
may affect the energy positions of the QWS.
Since deformation is a widespread characteristic of film growth on
substrates with lattice mismatch and was observed on epitaxial silver
films of the same thickness [39], its effect on the L'
2 energy should be
considered. The Ag band structure for deformed (stressed) lattices was
calculated through the empirical pseudopotential method (EMP) in Ref.
[40]. The described scheme is sufficient to describe the properties of a
simple band structure of Ag s–p electrons. In order to reproduce the
experimental value of −0.3 eV for the energy L'
2 [41] in an unstressed
lattice, the bands after the calculation were shifted by 225 meV. Since
the L'
2 value is determined using the EMP, the energy of the surface
state is derived from the phase accumulation model. This scheme can be
verified by using the temperature dependence of the energy of the sur-
face state, as made by Paniago et al. [31]. The temperature expansion
coefficient relates the sample temperature to the isotropic deformation
of the silver lattice. If we use the value 19 ⋅ 10−6 K−1 [42], then using the
described procedure, we obtain the value 0.12 meV/K for the shift of
the surface state depending on temperature. This result well agrees with
the experimentally determined value of 0.17 meV/K obtained in Ref.
[31]. The deviation may be due to the narrowing of the band gap L with
lattice vibrations that was calculated by Larsson and Pendry [43].
It is assumed that the stress that exerts pressure on the lattice and
accompanies the process of forming epitaxial Ag (111) films changes the
lattice constant of the (111) plane. As a result, the lattice constant of
the plane perpendicular to this one also changes. During deformation,
the volume of the crystal will be maintained. This condition was used in
calculations when describing lattice deformation. In the right part of
Fig. 6, the results of a theoretical review are shown. The calculated en-
ergy of the surface state is already strongly shifted at low tensile stress-
es in the (111) plane (compressed along the [111] direction). In order to
explain the observed shift of 150 meV, the Ag (111) lattice grown epi-
taxially on Si (111) must be deformed by approximately 0.95%. A ten-
sile stress of this magnitude observed in silver films of comparable
thickness on MgF2, Si (100) and mica [39] was attributed to the poly-
crystalline growth of Volmer–Weber. It was suggested that its nature
belongs to the relaxation of grain boundaries and the effects of recrys-
tallization in a silver layer. Increased recrystallization due to the subse-
quent annealing stage should lead to a further increase in the tensile
512 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
stress. In addition, the lattice order is improved, as evidenced by LEED
spots, and the surface is levelled that is a necessary condition for ob-
serving QWS in the s–p band (Figs. 4 and 5). Differences in the tem-
perature expansion of silicon and silver cannot contribute to the defor-
mation presented in this system, since the deposition and measurement
were carried out at the same temperature. Due to the limited attenua-
tion length of 28 Å [37], the energy of the surface state during deforma-
tion changes only for the uppermost layers of film.
Silver layers obtained in a similar way on GaAs (110) substrates also
show quantum-mechanical peaks indicating uniform growth morpholo-
gy, but with no surface states. In Ref. [3], using scanning tunnelling
microscopy, it was shown that the surface state is absent on the Ag (111)
structure. However, there are data for which the deformation is a con-
troversial issue.
Jiang et al. [44] described the procedure of measurements of both
the surface structure and electronic properties of thin silver films. Us-
ing scanning tunnelling spectroscopy (STS), thin Ag films grown on a
GaAs (110) substrate and obtained by a two-step method were studied
[3]. The STS method allows us to study unoccupied electron states on
the surface of films, which are above the Fermi level, in contrast to the
photoelectron-spectroscopy method used earlier, in which the range of
recorded energies is limited to the Fermi level.
The STS spectra, which show the dependence (dI/dV)/(I/V)mean of the
voltage V, are shown in Fig. 7. All spectra have three significant peaks
in the density of states. Two of them are associated with occupied (V < 0)
electronic states and one with unoccupied (V positive) state. The peaks
that are observed below EF, i.e., associated with the occupied states,
change with a change in the film thickness, although the peak of free
electronic state did not respond to the film thickness. The occupied
states can be associated with QWS that appeared under the restriction
on z of the Ag film, while the unoccupied states are the Shockley’s sur-
face states (energetically, they occupy the positions at the level of
≈180 meV).
The authors of Ref. [44] used the quantization condition for the
wave vector of stationary QWS given above to determine the kz value.
Using the data in Fig. 7, the authors plotted the dependence of the en-
ergy levels (peaks in Fig. 7) on the film thickness (Fig. 8).
Analysis of the energy positions of the QWS and the thickness of
films allows one to derive the s–p band dispersion in thin Ag films. The
principal quantum number n in the first Brillouin zone must be between
1 and N (N is the number of atomic layers). Therefore, the first occu-
pied state below EF corresponds to the QWS with n = N − 1 and the wave
vector will be kz = (N − 1) π/Na. The wave vector at the boundary of the
Brillouin zone (point L) is then reads as kzL = π/a − kz = π/Na. By anal-
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 513
Determinism of the Symmetry of a Single-Crystalline Surface
ogy, for the wave vector of the neighbouring state, the formula will be
as follows: kzL = 2π/Na.
Figure 9 shows the band structure along the direction of Γ–L. The
solid line describes the band structure of bulk silver. Around point L,
the data behaves similarly to pure Ag(111) (solid line). Nevertheless,
the experimentally observed energy values shifted upward by 190 ± 20 meV
relative to theoretical values. With increasing distance from point L,
they deviate more significantly towards higher energies. Thus, the dis-
persion and the width of the band of thin Ag films on GaAs(110) sub-
strates are smaller than those are known for the theoretical band struc-
ture of pure Ag.
During the construction of the experimental data of the band struc-
ture, the correction C in the above-mentioned equation for kz was not
taken into account that is associated with the influence of the inter-
faces. Indeed, on the one hand, the amendment would introduce a hori-
zontal shift, but would in no way affect the energy shift, since, around
point L, the energy states are above the maximum of s–p band for pure
Ag(111) (Fig. 9). On the other hand, the phase shift at the Ag–vacuum
interface changes very little with a change in thickness and the contri-
bution to the band structure of this interface is insignificant [4, 16]. In
this case, EF lies at the level of the band gap of GaAs on the side of the
Ag–GaAs interface. Therefore, electrons with energies close to EF should
be Bragg reflected from this interface and the phase shift should be ap-
proximately π.
Fig. 8. Energy positions of the STS
spectra peaks vs. the film thickness
[44]
Fig. 7. STS spectra of Ag films with
thicknesses of 2.0–4.5 nm [45]
←
514 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
For a detailed analysis of the surface states, the authors of [44] de-
posed potassium on the surface and compared the STS spectra. As Fig-
ure 10 shows, after the deposition of potassium, energy of free states
decreases by ≈190 meV, and these states are occupied. Deposition did
not affect the occupied states. This potassium deposition effect can be
explained, taking into account the fact that potassium reduces the work
function of the sample. At the basis of the phase accumulation model,
Shockley’s states are shifted to lower energies due to a decrease in the
vacuum barrier, i.e. the work function. The ≈190 meV shift for Shock-
ley’s states should be due to the decrease of the work function by 1.2 eV
[16]. Similar shifts for Shockley’s states, with a decrease in the work
function, were also observed for Ag films grown on Si (111) surfaces
[16] and on surfaces of other noble metals [33, 34]. This experiment
confirms the assumption that the main observed maximum in the free
states belongs to the Shockley’s surface state.
In Figure 10, potassium deposition does not change the QWS posi-
tions, although lowering the work function should increase the length
of the QWS wave function tails deep into the barrier in the direction of
vacuum. According to rough estimates, a decrease in the work function
of 1.2 eV leads to a change in the wave vector of first quantum-well
state only by Δkz (n = N − 1) < 0.05 nm−1 that corresponds to the energy shift
of the QWS less than 20 meV. Such a small shift cannot be resolved in
measurements at the room temperature.
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Fig. 10. The STS spectra obtained for clean surface of 1.5 nm thick Ag film on
GaAs (110) and after deposition of 0.2 nm of K on the Ag film surface [44]
Fig. 9. The s–p band structure of the Ag
film near the point L along the Γ–L. The
circles show the energy states for QWS ob-
tained via the STS method [44]
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Determinism of the Symmetry of a Single-Crystalline Surface
After analyzing the energy positions of the surface states of the
bulk (111), Jiang et al. [44] concluded that the surface states of thin Ag
films on the GaAs (110) surface are shifted upwardly by 210 ± 30 meV.
This shift in magnitude is comparable to the shift observed for the dis-
persion of the s–p band.
The energy shifts of the s–p band as well as a significant decrease
in the width of the band during film dispersion as compared to the bulk
material may be due to the lattice stress in thin films. It was shown that
an increase in the temperature of noble metal crystals causes a shift of
the band structure upward toward EF [31, 46] due to a temperature in-
crease in the lattice constant at high temperatures. An increase in the
lattice causes a decrease in the overlap of the wave functions, reducing
the width of the band. Using the results of calculations based on the
empirical pseudopotential method (EPM), the authors of [44] estimated
that a shift of about 200 meV corresponds to a planar tensile strain
Δa ≈ 1%. Ag thin film on GaAs(110) has a superstructure. The appear-
ance of the superstructure confirms that the film is stressed. The LEED
studies also confirm the presence of deformation. Therefore, [111] ori-
entation of the Ag film is deviated by approximately 4° in accordance
with the orientation [110] of the GaAs substrate [47, 48]. If we assume
that the Ag–GaAs interface has the same slope, we can assume an Ag
film as (667)-oriented film with (111) microfaces. In such a structure,
the distance between two steps on the Ag(667) surface is 3.16 nm that
is greater about 2 times than the average distance (1.5 nm) between the
bands of the quasi-periodic modulated surface [49]. In such a structure,
unrelaxed Ag (667) films should have a large lattice mismatch of ap-
proximately 6% as compared with the GaAs (110) lattice along the [001]
direction. It is likely that the lattice mismatch partially weakens the
quasi-periodic superstructure, which leads to an internal lattice stress.
The authors of [44] observed identical quasi-periodic superstructures in
all Ag films, regardless of their thickness. In this connection, at a stress
in a thin film, an upward shift of the electron s–p band occurs.
Thus, the upward shift of surface states can be associated with the
upward shift of the electron s–p band and the effect of lattice stress. In
the model of the phase approach, Shockley’s states occupy the lowest
state in the potential well limited by the potential barrier from the
vacuum side and the band gap of the crystal from the other side. The
energy of Shockley’s states depends on the work function as well as on
the position of the edge of the band gap (point L). In this case, the last
shifts upward by 190 ± 20 meV in comparison to the energy band struc-
ture of the bulk material of f.c.c. Ag (111) at L point.
Jiang et al. [44] proved why other unoccupied states did not arise
for the QWS. The s–p band of electrons of f.c.c. Ag has a wide band gap
of 4.2 eV along the Γ–L direction near the point L [50]. The range of
516 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
voltages applied to the sample from 0 to 1.5 V was within the energy
limits of the band gap. Therefore, there could be no free QWS states
along the Γ–L direction. The electron energy in this direction does not
increase, but increases along the lateral directions (Γ–Õ and Γ–W).
A group of Japanese scientists in the paper of Sawa et al. [51] stud-
ied the thickness-dependent behaviour of Shockley’s surface states. They
were interested in the question-challenge, due to what the upward shift
of the bottom of the surface dispersion band occurs with a decrease in
the thickness of the Ag film. The dI/dV graphs show the standing waves
of surface electrons that appear at the edges of the steps, the monolayer
well and partial dislocations (Fig. 11). Using these images, the wave-
length of the surface electron was found. In the calculations, the dis-
tance between the peaks of standing waves in the region distant from
the defects and dislocations was used in order not to take into account
the various quantum limitations of the electrons in these narrow sur-
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Fig. 13. Changing of the dispersion of the surface-state band because of the hy-
bridization with n = 1 QWS [51]
Fig. 12. Dispersion graphs of the surface states for the films of different thick-
nesses and for bulk Ag [51] (see also Ref. [3] in [51])
Fig. 11. STM (a) and dI/dV (b)–(d) images (31.5 × 31.5 nm2) for 20 ML thick Ag (111)
film, where the bias voltages VS is 0.35 V (a), 0.15 V (b), 0.25 V (ñ), and 0.35 V (d)
[51]
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 517
face regions. With the determination of the wavelength λ, the plane
wave vector k║ = 2π/λ was actually computed. Having found the surface
electron energy E (equals to bias voltage Vs), the authors of the work
were able to construct the dependence E(k2
║) plotted in Fig. 12. From
this figure, several consequences were concluded. First, surface states
have a parabolic dispersion. Secondly, a 40 ML thick film has dispersion
close to the dispersion of the surface states of bulk Ag (111). Thirdly,
the energy shifts upward with decreasing film thickness (for energies
with k║ = 0, the shift is 77 meV for a film with a thickness of 40 ML,
while 77 + 26 meV for a 7 ML thick film).
The fact of the shift of the bottom of the surface-state band Å0 due
to the hybridization of the latter with the valence band of the substrate
was refuted. For the Si (111) substrate, the valence band maximum is at
the level of −0.3 eV below the Fermi level, and the bottom of the surface
state band Å0 for the bulk Ag is only at the level of −63 meV, conse-
quently, the energy levels do not overlap, and thus, hybridization is
impossible. Although, e.g., for Ge (111) substrates, it is impossible to
say so clearly, since the maximum of the valence band in this case is
very close to the Fermi level.
The fact of hybridization of the surface state band with QWS inside
the film was also refuted. One can observe in Fig. 13 the dispersion of
the surface band (dashed line) and the QWS with n = 1 (dash-dotted
line). These two states intersect at k║ = 2.51 nm−1. However, degenera-
tion at the intersection begins and the two states are split into upper
and lower branches when the hybridization interaction HSQ = 〈QWS|V|SS〉
is introduced between the surface state and the QWS with n = 1 at their
intersection [51, 52], which are indicated in this figure as solid and
dashed lines. The exact HSQ value is unknown in the presented system.
Although, as reported, HSQ lies in the range from 20 to 180 meV in Bi/
Ag films on a Si (111) substrate [51, 52]. Thus, in this study, the vari-
ance of split branches was calculated with HSQ = 100 and 200 meV.
The theoretical and experimental data on Å0 and the plane effective
mass m∗ are given in Table below.
The thickness dependence of the theoretically and experimentally
found Å0 and m∗ values for surface band and QWS film with n = 1
Number
of Ag ML
E0 QWS
(n = 1), eV
Crossing,
nm–1
Experiment HSQ = 100 meV HSQ = 200 meV
E0, meV m∗/m0 E0, meV m∗/m0 E0, meV m∗/m0
7 −1.08 4.07 26 0.37 −54 0.42 −27 0.41
10 −0.83 3.54 −6 0.37 −52 0.41 −18 0.40
20 −0.45 2.51 0 0.34 −52 0.38 −19 0.36
30 −0.38 2.26 −11 0.39 −53 0.37 28 0.35
40 −0.31 2.01 −51 0.42 −49 0.34 46 0.34
Determinism of the Symmetry of a Single-Crystalline Surface
518 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
Due to hybridization, it is assumed that E0 moves downward and m∗
becomes larger with decreasing thickness. However, in the experiment,
inverse dependences on thickness were observed (the 4-th and 5-th col-
umns in Table). Therefore, it was excluded from consideration about the
hybridization of the surface state and QWS as the cause of the observed
shift of the surface states of the Ag(111) films. This calculation indi-
cates that HSQ is very small, and no significant splitting occurred in the
presented Ag/Si(111) system.
Sawa et al. considered the change in the electronic structure of Ag
films caused by stress [16]. The lattice constant for Ag is 25% less than
for Si. The calculation using the EPM demonstrated that the plane ten-
sile strain shifts E0 upward on the surface of the Ag(111) film [16].
Indeed, as the film thickness increases, the misfit stress gradually
weakens in the heteroepitaxial system [53]. From this point of view, it
is reasonable to assume that E0 shifts upward, since the thickness of the
Ag film decreases, since a decrease in thickness increases the flat tensile
strain. This explanation also agrees with the results of the previous
study using photoelectron spectroscopy of the temperature-dependent
shift E0 on the surfaces of bulk Ag(111) [31]. Application of the method
of photoelectron spectroscopy shows that the shift upward of E0 at the
temperature increase is observable. The same effect is observed due to
the stress.
In addition, the calculation with the usage of the EPM indicates
that 0.95% of the value of flat tensile stress causes E0 to be shifted
upward by 150 meV [16]. This result confirms that the accumulated
stress in the film was not 25%, even for an Ag film with a thickness of
7 ML on the Si(111) substrate. STM studies showed that Ag films con-
tain many dislocations even at a very early stage of the growth [54].
That is why the authors of Ref. [51] interpreted the small shift E0 by
stress relaxation.
4. Quasi-Periodic Superstructures of Ag on Single-Crystal Surfaces
The appearance of the superstructure, which is formed by an Ag film
deposited on a GaAs(110) surface, has been studied by Ebert et al. [49].
They found that 1D quasi-crystals acting as a quasi-periodic self-similar
superstructure are formed on the film. The nature of defects changing
the surface superstructure of film is also ascertained.
The 1D quasi-periodic structure is observed in the formation of thin
Ag layers with a thickness of 1.5–1.7 nm using the two-step method [3].
All Ag films exhibit 1D modulation in height leading to bands with
0.05 nm grooves on STM images (Fig. 14).
Figure 14 demonstrates that the bands are clear, not having the
same separation, and do not form an explicit periodic superstructure.
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 519
Determinism of the Symmetry of a Single-Crystalline Surface
Two different basic separation intervals with distances between the
bands of about 1.2 ± 0.2 and 1.7 ± 0.2 nm can be distinguished (Fig.
14, b). The authors identified them with short (S) and long (L) sec-
tions, respectively. Figure 14, a shows that at low magnifications STM
images show bands similar to those in Fig. 14, b. Nevertheless, in Fig.
14, a, there are significantly longer distances between the bands than
in the case of two base bands. Large-size bands arise due to additional
height modulation, which overlaps with base-height modulation, re-
sulting in L and S regions. Figure 14, c shows the Fourier transform
of the bands. The peaks in the Fourier transform are well described
and numbered [55] in the basis of two basic elements whose lengths are
related to each other according to the principle of the golden section
in inverse space. Peaks beyond 1/S are associated with the substruc-
ture of the bands and they exhibit properties, which are described by
the golden section principle (peak 1.6/S). Due to the Fourier transform
as well as spatial images, it was found that the ratio of the long band-
separating interval to the short on the STM images is 1.55 ± 0.15. This
Fig. 14. The STM images for
the 1.5 nm thick Ag film su-
perstructure [3] on the
GaAs (110) surface (a, b) and
the Fourier transform (c)
[55]
520 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
ratio is consistent within the framework of errors with the ratio of two
consecutive members of the Fibonacci sequence for large values of their
numbers (Fn, Fn+1 are sequence members, Fn + 1/Fn = φ, where (1 5) 2ϕ = +
equal to 1.618… is golden ratio). Self-similarity and Fourier transform
do not contradict the quasi-periodic type of order.
The bands form a sequence of long and short sections. Such a se-
quence is indicated in the lower part of Fig. 14, b. A large number of
such sequences were analysed (with lengths up to 135 areas and a total
number of areas over 1500 taken from different Ag films) in order to
determine statistically the structural model, which best fits the experi-
mental observations.
Comparison with the Fibonacci sequence shows that the experimen-
tally observed data best fit the sequence of the Fibonacci golden section,
since it has the least number of irrelevant sequences. The best observed
in the experiment is described by a quasi-periodic golden section se-
quence with a coherence length of approximately 12.5 nm. This conclu-
sion is also consistent with the LEED data, which can be well explained
with taking into account quasi-periodic ordering of the golden section.
It cannot be excluded that such a structure can be described using a
high-order approximating sequence. However, high-order approximat-
ing sequences and quasi-periodic structures differ little, and recogni-
tion at this level is beyond the limits of the statistical accuracy under
consideration.
The limited coherence length indicates that defects must be present
in the sequences. It has been detected that the main defect is the fre-
quent absence of a short section. This one leads to three, and sometimes
even more consecutive, long sections. The importance of this type of
defect is confirmed by observation of dislocations that correct these
sequences from three long sections on the LLSL sequence. It has been
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Fig. 15. STM images (with different scales) of the LLL sequence and
dislocation correcting this sequence [55]
ISSN 1608-1021. Usp. Fiz. Met., 2019, Vol. 20, No. 3 521
Determinism of the Symmetry of a Single-Crystalline Surface
shown that the sequences defined by dislocations have much better
agreement with the Fibonacci sequence. The coherence length of the cor-
rected sequences increases to almost 11 regions or 17 nm. The number
of L regions decreases from 66% to 62% when adjusted, providing a
very good agreement with that for the ideal Fibonacci sequence (≈61.8%).
Thus, the missing short sections are main defects.
Three consecutive long intervals between areas are labelled as LLL.
In the position indicated by the arrow, one additional strip is inserted,
which shows a short separation interval with the adjacent strip (section
S), i.e. the dislocation generates a short section. It was found that such
properties were observed with a concentration of approximately 5⋅1010
cm−2. Each observed dislocation has a Burgers vector oriented parallel to
the quasi-periodic direction ([001] direction of the GaAs(110) substrate)
with a short separation interval length. A pair of dislocations with op-
posite Burgers vectors was observed frequently, as shown in Fig. 15, a;
however, isolated dislocations were observed as well. In Figure 15, a, we
can see an STM image of such a LLL defect, which can be referred to as
a domain wall or as a grain boundary.
In addition to dislocations, there are still other defects responsible
for a limited coherence length. Figure 16 shows the most common ones—
phason defects. A large degree of disorder occurs due to phason defects.
Phase defects by definition are a local displacement of one position of a
quasi-periodic lattice to another neighbouring position, violating the
quasi-periodic structure. Surface phason defects in Fig. 16 were ob-
served with a concentration of circa 1012 cm−2 [55].
A significant part of phason defects is not uniformly distributed
over the surface. Small light circles in Fig. 15, b show that phason de-
Fig. 17. Distribution of phason de fects
close to the dislocation cores
Fig. 16. STM image of Ag film surface
with a phason defect [55]
522 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
fects arise close to the core of the dislocation. The STM image indicates
that phason defects propagate mainly along the [001] direction from the
dislocation core. A statistical analysis of the distribution of phason de-
fects close to the dislocation cores is represented in Fig. 17 [55]. The
size of the points in Fig. 17 is proportional to the number of phason
defects (within the range of 1–8) per area unit around 14 dislocations.
One division along the axes in Fig. 17 corresponds to a length of 3 nm;
the centre of coordinates coincides with the core of the dislocation; the
strip inserted during dislocation is located on the left side of the x-axis [55].
The authors of Ref. [49] found that all the band shifts due to pha-
son defects occur in the direction opposite to the dislocation core. Thus,
dislocations cause oriented phason defects. The appearance of phason
defects can be explained from the point of stress relieving; they are
close to the core of the dislocation, since phason defects increase the
size of the interband interval that is necessary when an additional band
is added-on during dislocation. In this case, the static stress field around
dislocations is a source of phason defects, whereas early work on icosa-
hedral quasi-crystals reported that the appearance of phason and disor-
der is associated with dislocation movements [56, 57].
5. Morphological Features of Nanostructures
of Noble Metals and In during Their Thermal Deposition
on the Si Single Crystal Surfaces
The studies of surface nanorelief were performed on a JSPM-4610 tun-
nelling microscope (JEOL, Japan). The working vacuum quality during
the experiment was such that the pressure was ≤10−8 Pa. Plates of sili-
con Si(111) and Si(110) single crystal with a size of 7 × 1 × 0.3 mm3 were
used. Preparation of single crystal surfaces was performed by standard
methods. Initially, a current of ≈0.2 A was conducted through the sili-
con plate for one day. In this way, the sample was heated up to ≈250 °C.
After that, the current conducting through the sample raised to 3.0 A
being maintaining for 30 s, which corresponded to the sample tempera-
ture of about 950 °C. Then, the sample was cooled, after which the (111)
and (110) surfaces were imaged via a tunnelling microscope (Fig. 18).
All studies on a tunnelling microscope were performed in the dc regime.
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Fig. 18. STM images of the Si single-
crystal surfaces: Si (111) (a) and Si (110)
(b) [58]
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Determinism of the Symmetry of a Single-Crystalline Surface
Gold, silver, copper, and indium were deposed on the surfaces pre-
pared by the thermal evaporation method. As an evaporator, we used a
spiral tungsten cuvette containing a metal sample; the cuvette occupied
the middle of a metal cylinder with a hole of 3 mm. The distance be-
tween the sample and the evaporator was ≈7 cm. The deposition oc-
curred at a current of ≈5.0 A through a tungsten coil, which corre-
sponded to the temperature of ≈100 °C above the melting point of the
metal. The time of deposition was about 1–3 s. The deposition of metal
on a single crystal surface was performed without heating or cooling the
sample. Tunnel spectra were studied using a high-vacuum tunnel spec-
trometer with atomic resolution of the company JEOL (Japan).
Fig. 19. Gold nanos-
tructures on the
Si (111) (a–e) and
Si (110) (f–h) surfac-
es, and profile curves
(i–k) for some images
(a, e, g) [59]. Arrows
(a, e, g) relate to scale
524 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
Noble metal nanostructures (Fig. 19) can be obtained by varying
deposition parameters [58–61]: the deposition time, the distance from
the cuvette to the sample, the pressure in the chamber, the melting
temperature of the cuvette, or the cooling of the sample.
Using the developed technology, we can obtain hexagonal clusters
with a hexagon side of ≈5 nm (Fig. 19, a). The geometry of such struc-
tures is close to that of the Si (111) 7 × 7 single crystal surface (Fig. 18).
Figure 19, b shows the chain ordering of clusters. Under certain techno-
logical conditions, we obtained ‘fractal’ leaf-like gold nanostructures
(Fig. 19, c). Needle-like crystals (Fig. 19, d) can be grown under the
longer deposition times (≈1 min). The study showed that the stable hex-
agonal-pyramidal structures of gold could be obtained only on the Si (111)
plane. Meanwhile, on the Si (110) plane, we obtained the structures
shown in Fig. 19, f, which are characterized by the presence of hexagons
Fig. 20. Flakes of gold on the Si (111) surface (a–c), where the
arrows indicate a scale, and corresponding profiles (d–f) [59]
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Determinism of the Symmetry of a Single-Crystalline Surface
without the formation of pyramids. For short deposition times and vac-
uum up to 10−6 Pa, we observed clusters with a small size distribution
(6–8 nm). In this case, an increase of the time of deposition led to the
formation of cluster conglomerates (Fig. 19, g).
Currently, the investigation and production of monolayer metallic
coatings in a higher vacuum is of the significant interest. Combining
some methodical and technological characteristics, we reached such a
deposition regime, which allowed us to obtain monolayer flake-like gold
formations (Fig. 19, h). There are areas within the flakes not filled with
atoms. After the spectral analysis using the tunnel spectroscopy, we
revealed that electron states in these vacancies might possess specific
features. Particularly, they can be quantized according to the quantum
dots principle.
The parameters of flake shown in Fig. 20. Earlier in [59], we sug-
gested that free sagging flake edges might be possible. However, an
adequate answer to this question one can provide by the 3D-microscopy
only. The case of free existence of a metal monolayer (or its edges in
this case) contradicts the solid-state physics general canons.
Analysing vacancies (with diameter of ≈0.5 nm), we noticed that Au
atoms are absent in amount of ≈1–3 atoms (Fig. 20, b).
Similar situation was observed for Cu deposited with the same tech-
nological parameters as Au; the behaviour of formed nanostructures is
very close to the morphological features for gold described above. Hex-
agonal-pyramidal nanostructures of copper are shown in Fig. 21.
Thus, self-ordered hexagonal-pyramidal nanostructures are formed
on Si (111) by thermal evaporation of both Cu and Au. The ordering is
characterized by parallelism of the corresponding sides of the bipyramid
as well as their respective orientation relative to the sides of the 7 × 7
hexagon of the structure of silicon.
The heights of the bipyramidal formations belong to the range
1–1.5 nm, as can be seen from the vector profiles. The thickness of
growth of steps is of ≈0.15 nm that corresponds to the size of an atom.
Observed ‘texturing’ in all the figures indicates that all bipyramids
Fig. 21. Pattern of copper nanostructures on the Si (111) surface: 2D diagram (a)
and height curve (b). White arrow (a) relates to scale
526 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
have the same orientation with respect to the interface structure of the
base. Therefore, the symmetry of the interface plane is crucial in ob-
taining such ordered nanostructures.
The observed growth of steps corresponds to atomic planes. The
characteristic distance from the beginning of the plane to the next one
is (as is in the case of Au) ≈3 nm [58, 59]. For Cu as well as for Au at-
oms, it is energetically more advantageous to begin formation of the
next plane from this distance. In the case of copper deposition on the
(110) surface of a single Si crystal, the observed pattern of nanorelief is
similar to the image obtained for Au deposition. Copper, like gold, does
not form pyramidal nanostructures on the Si(110) surface (Fig. 19, f).
Mentioned above may indicate that the deposition of the atomic Au
and Cu gases is partially, but not completely, described by traditional
schemes for the nanorelief formation. The dynamic image of a steady
flow of atoms is defined by the difference between the flows to and from
the surface. Varying the technological parameters of deposition [58–61],
we can obtain one or another morphological pattern of the noble metal
surface.
In the case of the indium deposition on the (111) and (110) surfaces
of the Si single crystals, a completely different mechanism of forma -
tion of nanostructures is realized (Fig. 22). The formation of predomi-
nantly spherical In clusters is observed on short deposition times (1–
3 s). In addition, clusters close to hexagonal or rectangular shape may
Fig. 22. Indium nanostructures on the Si (111) surface
Fig. 23. Profile of indium roughness on the Si (111) surface: 2D diagram (a) and
height curve (b)
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Determinism of the Symmetry of a Single-Crystalline Surface
be observed (Fig. 22, a). The formation of hexagonal clusters on the
surface of shapeless cluster (Fig. 22, b) was observed when the deposi-
tion time was increased up to 5 s. Furthermore, one can see the position-
ing of rectangular and square clusters. The formation of clusters of
correct symmetry unambiguously indicates the formation of indium
nanocrystals.
Indium has a much lower melting point (156.6 °C) as compared to
gold and copper. Under the same technological parameters of deposition
as for gold and copper, we obtained molten indium, which is many times
overheated. Its deposition onto the uncooled surface of silicon single
crystal resulted to formation of the clusters of form mentioned above.
When the deposition time was increased above 5 s, it led to the for-
mation of the bunch of clusters of predominantly cubic form (Fig. 22, c).
An average side size of such cubic formations: 4–5 nm.
It is noteworthy that this type of samples has the profile of irregu-
larities with a height of 0.6–3 nm (Fig. 23). There is also a periodic
relief substructure in the form of line bunches (Fig. 22, d).
Figure 24 shows the tunnel spectra for the two samples. Curve in
Fig. 24, a demonstrates the density of electronic states (DOS) for image
in Fig. 22, a. A certain band gap at the Fermi level indicates a non-
metallic character of the cluster, which attributes to ≈10 nm size clus-
ters of In. Figure 24, b shows modification of the DOS caused by the
surface morphology completely filled with bunches of clusters. The DOS
curve is much closer to that of indium in the metallic phase. The first
peaks in the region of occupied states characterize the p states of indi-
um. For a single cluster, they are localized at ≈1.8 eV and have a narrow
peak. But this maximum has a practically non-zero value in the region
of zero binding energies, shifts to the region of high binding energies
upon transition to the coating. The same tendencies of the DOS curve
changing have been observed for the region of free states.
Fig. 24. Densities of elec-
tronic states corresponding
to images in Figs. 22, a (a)
and d (b)
528 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
L.I. Karbivska, V.L. Karbivskyy, and A.O. Romanskyy
6. Summary
‘Quantum engineering’ of the silver films growing on semiconductor
substrates allows obtaining new forms of the matter. Analysis of the
growth of ultrathin metal films convinces that quantum mechanics plays
an important role in the design of atomically flat metal layers.
The results on the energy dispersion of electronic states in epitaxial
Ag(111) films obtained on Si(001) and Si(111) surfaces are presented.
Splitting of energy bands is explained; analysis of the Shockley’s sur-
face states is given. Superstructures, which are formed on the surface
of monolayer silver nanostructures, are analysed in detail. A detailed
analysis of the energy states of the noble metal quantum wells is given.
The mechanism of formation of a nanorelief of a noble metal on the
(111) and (110) surfaces of a Si single crystal during multi-stage ther-
mal deposition is investigated. The symmetry of the interface surface of
the Si(111) 7 × 7 plane acts as a determinant factor in the growth mecha-
nism of the hexagonal-pyramidal structures of Cu, Ag, and Au.
The In surface morphological features on the Si(111) and Si(110)
surfaces investigated upon the thermal deposition. The regular cubic-
shape cluster patterns are observed that indicates the indium nanocrys-
tals formation. The density of electron states varies when the case of a
separate ≈10 nm-size In clusters on the Si(111) changes into the case of
bunch coating of the single crystal surface (coating thickness no more
than 30–40 nm).
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Received May 5, 2019;
in final version, July 30, 2019
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íà íàï³âïðîâ³äíèêîâèõ ï³äêëàäèíêàõ, ÿêå óìîæëèâëþº îäåðæàííÿ íîâèõ ôîðì
ðå÷îâèíè. Íàâåäåíî ðåçóëüòàòè ç åíåðãåòè÷íî¿ äèñïåðñ³¿ åëåêòðîííèõ ñòàí³â ó
åï³ òàêñ³àëüíèõ ïë³âêàõ Ag (111), îäåðæàíèõ íà Si (001) òà Si (111). Ïîÿñíåíî ðîç-
ùåïëåííÿ çîí ³ íàäàíî àíàë³ç ïîâåðõíåâèõ ñòàí³â çà Øîêë³. Äåòàëüíî àíàë³çóþòüñÿ
íàäñòðóêòóðè, ÿê³ óòâîðþþòüñÿ íà ïîâåðõí³ ìîíîøàðîâèõ íàíîñòðóêòóð ñð³áëà.
Íàâåäåíî äåòàëüíèé àíàë³ç åíåðãåòè÷íèõ ñòàí³â êâàíòîâèõ ÿì øëÿõåòíèõ ìåòà-
ë³â. Äîñë³äæåíî ìåõàí³çì ôîðìóâàííÿ íàíîðåëüºôó øëÿõåòíîãî ìåòàëó íà ïî âåðõ-
íÿõ (111) ³ (110) ìîíîêðèñòàëó Si ïðè áàãàòîñòàä³éíîìó òåðì³÷íîìó íàïî ðîøåíí³.
Ñèìåòð³ÿ ïîâåðõí³ ³íòåðôåéñó ìîíîêðèñòàë³÷íî¿ ïëîùèíè êðåìí³þ Si (111) 7 × 7
º äåòåðì³íóâàëüíîþ ó ìåõàí³çì³ ðîñòó ãåêñàãîíàëüíî-ï³ðàì³äàëüíèõ ñòðóêòóð ì³ä³,
ñð³áëà òà çîëîòà. Äîñë³äæåíî ìîðôîëîã³÷í³ îñîáëèâîñò³ ïîâåðõí³ ³íä³þ ïðè éîãî
òåðì³÷íîìó íàíåñåíí³ íà ïîâåðõí³ Si (111) ³ Si (110). Ñïîñòåð³ãàºòüñÿ óòâîðåííÿ
êëàñòåð³â ïðàâèëüíî¿ êóá³÷íî¿ ôîðìè, ùî ñâ³ä÷èòü ïðî ôîðìóâàííÿ íàíîêðèñòàë³â
In. Óòâîðåííÿ íàíîêëàñòåð³â In (ðîçì³ðîì ó ≈10 íì) íà ïîâåðõí³ Si(111) ³ ïîäàëüøå
çì³íåííÿ ìîðôîëî㳿 ïîâåðõí³ ìîíîêðèñòàëó ìîäèô³êóþòü ðîçðàõîâàí³ êðèâ³ ãóñ-
òèíè åëåêòðîííèõ ñòàí³â.
Êëþ÷îâ³ ñëîâà: êâàíòîâ³ ÿìè, åíåðãåòè÷íà äèñïåðñ³ÿ, øëÿõåòí³ ìåòàëè, ïîâåðõíÿ,
ìîðôîëîã³ÿ, ñêàíóâàëüíà òóíåëüíà ì³êðîñêîï³ÿ, òåðì³÷íå íàïîðîøåííÿ.
532 ISSN 1608-1021. Prog. Phys. Met., 2019, Vol. 20, No. 3
V. Y. Bondar, V. E. Danilchenko, V. F. Mazanko, O. V. Filatov, and V. E. Iakovlev
Ë.È. Êàðáîâñêàÿ, Â.Ë. Êàðáîâñêèé, À.À. Ðîìàíñêèé
Èíñòèòóò ìåòàëëîôèçèêè èì. Ã.Â. Êóðäþìîâà ÍÀÍ Óêðàèíû,
áóëüâ. Àêàäåìèêà Âåðíàäñêîãî, 36, 03142 Êèåâ, Óêðàèíà
ÄÅÒÅÐÌÈÍÈÇÌ ÑÈÌÌÅÒÐÈÈ ÌÎÍÎÊÐÈÑÒÀËËÈ×ÅÑÊÎÉ
ÏÎÂÅÐÕÍÎÑÒÈ ÃÐÀÍÈÖÛ ÐÀÇÄÅËÀ ÏÐÈ ÏÎËÓ×ÅÍÈÈ 0D-
È 2D-ÑÒÐÓÊÒÓÐ ÁËÀÃÎÐÎÄÍÛÕ ÌÅÒÀËËÎÂ È ÈÍÄÈß ÍÀ ÊÐÅÌÍÈÈ
Îáçîðíàÿ ñòàòüÿ ïîñâÿùåíà «êâàíòîâîé èíæåíåðèè» âûðàùèâàíèÿ ïë¸íîê ñåðå-
áðà íà ïîëóïðîâîäíèêîâûõ ïîäëîæêàõ, êîòîðîå ïîçâîëÿåò ïîëó÷àòü íîâûå ôîð-
ìû âåùåñòâà. Ïðèâåäåíû ðåçóëüòàòû ïî ýíåðãåòè÷åñêîé äèñïåðñèè ýëåêòðîííûõ
ñîñòîÿíèé â ýïèòàêñèàëüíûõ ïë¸íêàõ Ag (111), ïîëó÷åííûõ íà Si (001) è Si (111).
Îáúÿñíåíî ðàñùåïëåíèå çîí è äàí àíàëèç ïîâåðõíîñòíûõ ñîñòîÿíèé Øîêëè.
Äåòàëüíî àíàëèçèðóþòñÿ ñâåðõñòðóêòóðû, êîòîðûå îáðàçóþòñÿ íà ïîâåðõíîñòè
ìîíîñëîéíûõ íàíîñòðóêòóð ñåðåáðà. Ïðèâåä¸í äåòàëüíûé àíàëèç ýíåðãåòè÷åñêèõ
ñîñòîÿíèé êâàíòîâûõ ÿì áëàãîðîäíûõ ìåòàëëîâ. Èññëåäîâàí ìåõàíèçì ôîðìèðî-
âàíèÿ íàíîðåëüåôà áëàãîðîäíîãî ìåòàëëà íà ïîâåðõíîñòÿõ (111) è (110) ìîíî-
êðèñòàëëà Si ïðè ìíîãîñòàäèéíîì òåðìè÷åñêîì íàïûëåíèè. Ñèììåòðèÿ ïîâåðõ-
íîñòè èíòåðôåéñà ìîíîêðèñòàëëè÷åñêîé ïëîñêîñòè êðåìíèÿ Si (111) 7 × 7 ÿâ ëÿ åò ñÿ
äåòåðìèíèðóþùåé â ìåõàíèçìå ðîñòà ãåêñàãîíàëüíî-ïèðàìèäàëüíûõ ñòðóêòóð
ìåäè, ñåðåáðà è çîëîòà. Èññëåäîâàíû ìîðôîëîãè÷åñêèå îñîáåííîñòè ïîâåðõíîñòè
èíäèÿ ïðè åãî òåðìè÷åñêîì íàíåñåíèè íà ïîâåðõíîñòè Si (111) è Si (110). Íàáëþ-
äàåòñÿ îáðàçîâàíèå êëàñòåðîâ ïðàâèëüíîé êóáè÷åñêîé ôîðìû, ÷òî ñâèäåòåëüñòâó-
åò î ôîðìèðîâàíèè íàíîêðèñòàëëîâ In. Îáðàçîâàíèå íàíîêëàñòåðîâ In (ðàçìåðîì
≈10 íì) íà ïîâåðõíîñòè Si(111) è äàëüíåéøåå èçìåíåíèå ìîðôîëîãèè ïîâåðõíî-
ñòè ìîíîêðèñòàëëà ìîäèôèöèðóþò ðàññ÷èòàííûå êðèâûå ïëîòíîñòè ýëåêòðîí-
íûõ ñîñòîÿíèé.
Êëþ÷åâûå ñëîâà: êâàíòîâûå ÿìû, ýíåðãåòè÷åñêàÿ äèñïåðñèÿ, áëàãîðîäíûå ìå-
òàëëû, ïîâåðõíîñòü, ìîðôîëîãèÿ, ñêàíèðóþùàÿ òóííåëüíàÿ ìèêðîñêîïèÿ, òåð-
ìè÷åñêîå íàïûëåíèå.
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