Behavior of the Ti-Zr-Ni thin film containing quasicrystalline and approximant phases under radiative-thermal action in transition modes
X-ray diffraction and SEM microscopy were used to study the structural and phase changes in a thin film obtained by magnetron sputtering of a Ti52Zr30Ni18 target (at.%) on a steel substrate under the radiation-thermal influence of pulsed hydrogen plasma on an QSPA Kh-50 accelerator. A technique has...
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| Veröffentlicht in: | Вопросы атомной науки и техники |
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| Datum: | 2020 |
| Hauptverfasser: | , , , , , , , , , |
| Format: | Artikel |
| Sprache: | English |
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2020
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/194355 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Behavior of the Ti-Zr-Ni thin film containing quasicrystalline and approximant phases under radiative-thermal action in transition modes / S.V. Malykhin, V.A. Makhlai, S.V. Surovitskiy, I.E. Garkusha, S.S. Herashchenko, V.V. Kondratenko, I.A. Kopylets, E.N. Zubarev, S.S. Borisova, A.V. Fedchenko // Problems of atomic science and tecnology. — 2020. — № 2. — С. 3-8. — Бібліогр.: 25 назв. — англ. |