Application features of the electrostatic systems for measuring the secondary electron emission yield

• Veröffentlicht in: Problems of Atomic Science and Technology
• Datum: 2023
• Hauptverfasser: Karpus, S., Shliahov, I., Liashchov, M., Borisenko, V., Kochetov, S., Tsiats’ko, E., Shopen, O.
• Format: Artikel
• Sprache: English
• Veröffentlicht: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2023
• Schlagworte: Applications and technologies
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/196202
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Application features of the electrostatic systems for measuring the secondary electron emission yield / S. Karpus, I. Shliahov, M. Liashchov, V. Borisenko, S. Kochetov, E. Tsiats’ko, O. Shopen // Problems of Atomic Science and Technology. — 2023. — № 4. — С. 184-189. — Бібліогр.: 8 назв. — англ.

The analysis of the experimental systems for research of secondary electron emission during the interaction of electron beams with matter is presented. The three most common and methodologically developed variants of exper-imental systems are considered. According to their design features and method...