Application features of the electrostatic systems for measuring the secondary electron emission yield

• Published in: Problems of Atomic Science and Technology
• Date: 2023
• Main Authors: Karpus, S., Shliahov, I., Liashchov, M., Borisenko, V., Kochetov, S., Tsiats’ko, E., Shopen, O.
• Format: Article
• Language: English
• Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2023
• Subjects: Applications and technologies
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/196202
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Application features of the electrostatic systems for measuring the secondary electron emission yield / S. Karpus, I. Shliahov, M. Liashchov, V. Borisenko, S. Kochetov, E. Tsiats’ko, O. Shopen // Problems of Atomic Science and Technology. — 2023. — № 4. — С. 184-189. — Бібліогр.: 8 назв. — англ.

The analysis of the experimental systems for research of secondary electron emission during the interaction of electron beams with matter is presented. The three most common and methodologically developed variants of exper-imental systems are considered. According to their design features and method...