Structural and optical studies of Cu₆PSe₅I-based thin film deposited by magnetron sputtering
Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film was deposited onto silicate glass substrate by non-reactive radio frequency magnetron sputtering. Structural studies were carried out using X-ray diffraction and SEM techniques. Spectrometric studies of transmission spectra of Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film in the temperat...
Gespeichert in:
| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2017 |
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2017
|
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/214911 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Structural and optical studies of Cu₆PSe₅I-based thin film deposited by magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V.Yu. Izai, V.V. Bilanchuk, P. Kúš, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 1. — С. 64-68. — Бібліогр.: 16 назв. — англ. |