Structural and optical studies of Cu₆PSe₅I-based thin film deposited by magnetron sputtering

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2017
• Автори: Studenyak, I.P., Kutsyk, M.M., Bendak, A.V., Izai, V.Yu., Bilanchuk, V.V., Kúš, P., Mikula, M.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2017
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/214911
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Structural and optical studies of Cu₆PSe₅I-based thin film deposited by magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V.Yu. Izai, V.V. Bilanchuk, P. Kúš, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 1. — С. 64-68. — Бібліогр.: 16 назв. — англ.

Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film was deposited onto silicate glass substrate by non-reactive radio frequency magnetron sputtering. Structural studies were carried out using X-ray diffraction and SEM techniques. Spectrometric studies of transmission spectra of Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film in the temperature interval 77 to 300 K were investigated. It is shown that the temperature behaviour of the optical absorption edge is described by the Urbach rule. Temperature dependences of optical parameters of the Urbach absorption edge and refractive index have been analyzed. The influence of temperature and structural disordering on the Urbach tail has been studied. The comparison of optical parameters of Cu₆PSe₅I crystal and Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film has been performed.