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Structural and optical studies of Cu₆PSe₅I-based thin film deposited by magnetron sputtering

Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film was deposited onto silicate glass substrate by non-reactive radio frequency magnetron sputtering. Structural studies were carried out using X-ray diffraction and SEM techniques. Spectrometric studies of transmission spectra of Cu₅.₅P₁.₂Se₅.₀I₁.₃ thin film in the temperat...

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Veröffentlicht in:	Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:	2017
Hauptverfasser:	Studenyak, I.P., Kutsyk, M.M., Bendak, A.V., Izai, V.Yu., Bilanchuk, V.V., Kúš, P., Mikula, M.
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2017
Online Zugang:	https://nasplib.isofts.kiev.ua/handle/123456789/214911
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Назва журналу:	Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:	Structural and optical studies of Cu₆PSe₅I-based thin film deposited by magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V.Yu. Izai, V.V. Bilanchuk, P. Kúš, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 1. — С. 64-68. — Бібліогр.: 16 назв. — англ.

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