Studenyak, I., Kutsyk, M., Bendak, A., Izai, V., Kus, P., & Mikula, M. (2017). Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Studenyak, I.P, M.M Kutsyk, A.V Bendak, V.Yu Izai, P. Kus, та M. Mikula. "Influence of X-ray Irradiation on the Optical Absorption Edge and Refractive Index Dispersion in Cu₆PS₅I-based Thin Films Deposited Using Magnetron Sputtering." Semiconductor Physics Quantum Electronics & Optoelectronics 2017.
Стиль цитування MLA (8-ме видання)Studenyak, I.P, et al. "Influence of X-ray Irradiation on the Optical Absorption Edge and Refractive Index Dispersion in Cu₆PS₅I-based Thin Films Deposited Using Magnetron Sputtering." Semiconductor Physics Quantum Electronics & Optoelectronics, 2017.