Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2017
• Автори: Studenyak, I.P., Kutsyk, M.M., Bendak, A.V., Izai, V.Yu., Kus, P., Mikula, M.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2017
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/214924
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V. Yu. Izai, P. Kus, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 2. — С. 246-249. — Бібліогр.: 12 назв. — англ.

Cu₆PS₅I-based thin films were deposited using non-reactive radio-frequency magnetron sputtering. Structural studies of thin films were performed by scanning electron microscopy, and their chemical composition was determined using energy-dispersive X-ray spectroscopy. As-deposited thin films were irradiated with wideband radiation of a Cu-anode X-ray tube at different exposure times. Optical transmission spectra of X-ray irradiated Cu₅.₅₆P1.₆₆S₄.₉₃I₀.₈₅ thin films were measured depending on irradiation time. The Urbach absorption edge and dispersion of refractive index for X-rays irradiated Cu₅.₅₆P1.₆₆S₄.₉₃I₀.₈₅ thin films were studied. It has been revealed that the nonlinear decrease of energy pseudogap and the nonlinear increase of refractive index occur with the increase of X-ray irradiation time.