Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering
Cu₆PS₅I-based thin films were deposited using non-reactive radio-frequency magnetron sputtering. Structural studies of thin films were performed by scanning electron microscopy, and their chemical composition was determined using energy-dispersive X-ray spectroscopy. As-deposited thin films were irr...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Date: | 2017 |
| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2017
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/214924 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V. Yu. Izai, P. Kus, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 2. — С. 246-249. — Бібліогр.: 12 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862530744576901120 |
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| author | Studenyak, I.P. Kutsyk, M.M. Bendak, A.V. Izai, V.Yu. Kus, P. Mikula, M. |
| author_facet | Studenyak, I.P. Kutsyk, M.M. Bendak, A.V. Izai, V.Yu. Kus, P. Mikula, M. |
| citation_txt | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V. Yu. Izai, P. Kus, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 2. — С. 246-249. — Бібліогр.: 12 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Cu₆PS₅I-based thin films were deposited using non-reactive radio-frequency magnetron sputtering. Structural studies of thin films were performed by scanning electron microscopy, and their chemical composition was determined using energy-dispersive X-ray spectroscopy. As-deposited thin films were irradiated with wideband radiation of a Cu-anode X-ray tube at different exposure times. Optical transmission spectra of X-ray irradiated Cu₅.₅₆P1.₆₆S₄.₉₃I₀.₈₅ thin films were measured depending on irradiation time. The Urbach absorption edge and dispersion of refractive index for X-rays irradiated Cu₅.₅₆P1.₆₆S₄.₉₃I₀.₈₅ thin films were studied. It has been revealed that the nonlinear decrease of energy pseudogap and the nonlinear increase of refractive index occur with the increase of X-ray irradiation time.
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| first_indexed | 2026-03-21T11:33:47Z |
| format | Article |
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| id | nasplib_isofts_kiev_ua-123456789-214924 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2026-03-21T11:33:47Z |
| publishDate | 2017 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Studenyak, I.P. Kutsyk, M.M. Bendak, A.V. Izai, V.Yu. Kus, P. Mikula, M. 2026-03-04T12:48:48Z 2017 Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering / I.P. Studenyak, M.M. Kutsyk, A.V. Bendak, V. Yu. Izai, P. Kus, M. Mikula // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 2. — С. 246-249. — Бібліогр.: 12 назв. — англ. 1560-8034 PACS: 78.40.Ha, 77.80.Bh https://nasplib.isofts.kiev.ua/handle/123456789/214924 https://doi.org/10.15407/spqeo20.02.246 Cu₆PS₅I-based thin films were deposited using non-reactive radio-frequency magnetron sputtering. Structural studies of thin films were performed by scanning electron microscopy, and their chemical composition was determined using energy-dispersive X-ray spectroscopy. As-deposited thin films were irradiated with wideband radiation of a Cu-anode X-ray tube at different exposure times. Optical transmission spectra of X-ray irradiated Cu₅.₅₆P1.₆₆S₄.₉₃I₀.₈₅ thin films were measured depending on irradiation time. The Urbach absorption edge and dispersion of refractive index for X-rays irradiated Cu₅.₅₆P1.₆₆S₄.₉₃I₀.₈₅ thin films were studied. It has been revealed that the nonlinear decrease of energy pseudogap and the nonlinear increase of refractive index occur with the increase of X-ray irradiation time. Mykhailo Kutsyk (contract number 51602011) is deeply grateful to the International Visegrad Fund scholarship for the funding of the project. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering Article published earlier |
| spellingShingle | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering Studenyak, I.P. Kutsyk, M.M. Bendak, A.V. Izai, V.Yu. Kus, P. Mikula, M. |
| title | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering |
| title_full | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering |
| title_fullStr | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering |
| title_full_unstemmed | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering |
| title_short | Influence of X-ray irradiation on the optical absorption edge and refractive index dispersion in Cu₆PS₅I-based thin films deposited using magnetron sputtering |
| title_sort | influence of x-ray irradiation on the optical absorption edge and refractive index dispersion in cu₆ps₅i-based thin films deposited using magnetron sputtering |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/214924 |
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