Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface

The influence of porous alumina template morphology on silicon film growth during deposition by PE CVD has been investigated. As it was shown, the structural properties of silicon phases depend on the pore geometry and surface morphology of the anodized porous alumina substrate. In the case of porou...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2017
Автори: Parfenyuk, P.V., Evtukh, A.A., Korobchuk, I.M., Glotov, V.I., Strelchuk, V.V.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2017
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/214950
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface / P.V. Parfenyuk, A.A. Evtukh, I.M. Korobchuk, V.I. Glotov, V.V. Strelchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 3. — С. 330-334. — Бібліогр.: 19 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Parfenyuk, P.V.
Evtukh, A.A.
Korobchuk, I.M.
Glotov, V.I.
Strelchuk, V.V.
author_facet Parfenyuk, P.V.
Evtukh, A.A.
Korobchuk, I.M.
Glotov, V.I.
Strelchuk, V.V.
citation_txt Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface / P.V. Parfenyuk, A.A. Evtukh, I.M. Korobchuk, V.I. Glotov, V.V. Strelchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 3. — С. 330-334. — Бібліогр.: 19 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description The influence of porous alumina template morphology on silicon film growth during deposition by PE CVD has been investigated. As it was shown, the structural properties of silicon phases depend on the pore geometry and surface morphology of the anodized porous alumina substrate. In the case of porous alumina formation in one stage, ripple-like morphology takes place. The growth of a-Si:H film is observed during deposition. After two-stage anodization, the porous alumina has a tipped/ribbed morphology. In this case, usually a-Si:H film grows on the bottom of the pores, and nc-Si:H/a-Si:H one grows on the tips. In the case of deep pores, the nanocrystalline nc-Si:H film grows only above the top of the pores. The obtained results could be used when developing new types of photocells, sensors, nanophotonics, and ionics devices.
first_indexed 2026-03-21T06:43:58Z
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
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language English
last_indexed 2026-03-21T06:43:58Z
publishDate 2017
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Parfenyuk, P.V.
Evtukh, A.A.
Korobchuk, I.M.
Glotov, V.I.
Strelchuk, V.V.
2026-03-05T12:04:14Z
2017
Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface / P.V. Parfenyuk, A.A. Evtukh, I.M. Korobchuk, V.I. Glotov, V.V. Strelchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 3. — С. 330-334. — Бібліогр.: 19 назв. — англ.
1560-8034
PACS: 78.30.Ly, 78.55.Mb, 81.05.Gh, 81.70.Fy
https://nasplib.isofts.kiev.ua/handle/123456789/214950
https://doi.org/10.15407/spqeo20.03.330
The influence of porous alumina template morphology on silicon film growth during deposition by PE CVD has been investigated. As it was shown, the structural properties of silicon phases depend on the pore geometry and surface morphology of the anodized porous alumina substrate. In the case of porous alumina formation in one stage, ripple-like morphology takes place. The growth of a-Si:H film is observed during deposition. After two-stage anodization, the porous alumina has a tipped/ribbed morphology. In this case, usually a-Si:H film grows on the bottom of the pores, and nc-Si:H/a-Si:H one grows on the tips. In the case of deep pores, the nanocrystalline nc-Si:H film grows only above the top of the pores. The obtained results could be used when developing new types of photocells, sensors, nanophotonics, and ionics devices.
This work was partially funded by the State Fund for Fundamental Research of Ukraine, grant F64/6-2016.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
Article
published earlier
spellingShingle Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
Parfenyuk, P.V.
Evtukh, A.A.
Korobchuk, I.M.
Glotov, V.I.
Strelchuk, V.V.
title Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
title_full Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
title_fullStr Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
title_full_unstemmed Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
title_short Peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
title_sort peculiarities of nanocrystalline silicon films growth on porous anodic alumina surface
url https://nasplib.isofts.kiev.ua/handle/123456789/214950
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