Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids

We calculated the dependence of the effective minority-carrier lifetime in black-silicon nano-textured with cones and pyramids on the diameter of the cone base, the side of the pyramid base, and the height of the cone and pyramid. The numerical calculation shows that the n-type polished plate of sin...

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Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2017
Автори: Onyshchenko, V.F., Karachevtseva, L.A., Lytvynenko, O.O., Plakhotnyuk, M.M., Stronska, O.Y.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2017
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/214951
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids / V.F. Onyshchenko, L.A. Karachevtseva, O.O. Lytvynenko, M.M. Plakhotnyuk, O.Y. Stronska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 3. — С. 325-329. — Бібліогр.: 18 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Onyshchenko, V.F.
Karachevtseva, L.A.
Lytvynenko, O.O.
Plakhotnyuk, M.M.
Stronska, O.Y.
author_facet Onyshchenko, V.F.
Karachevtseva, L.A.
Lytvynenko, O.O.
Plakhotnyuk, M.M.
Stronska, O.Y.
citation_txt Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids / V.F. Onyshchenko, L.A. Karachevtseva, O.O. Lytvynenko, M.M. Plakhotnyuk, O.Y. Stronska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 3. — С. 325-329. — Бібліогр.: 18 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description We calculated the dependence of the effective minority-carrier lifetime in black-silicon nano-textured with cones and pyramids on the diameter of the cone base, the side of the pyramid base, and the height of the cone and pyramid. The numerical calculation shows that the n-type polished plate of single-crystal silicon and the n-type plate of black silicon have a high minority-carrier lifetime in both the bulk and on the silicon surface, indicating high purity of both the bulk and the surface. However, the measured experimentally effective lifetime of minority carriers in the n-type black silicon is 1.55 ms and is determined by the surface lifetime. The measured effective lifetime of minority charge carriers in the p-type polished silicon is 1.24 ms. The minority carrier lifetime in the bulk of the polished p-type silicon is lower than the surface one.
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last_indexed 2026-03-21T13:45:42Z
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publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Onyshchenko, V.F.
Karachevtseva, L.A.
Lytvynenko, O.O.
Plakhotnyuk, M.M.
Stronska, O.Y.
2026-03-05T12:04:31Z
2017
Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids / V.F. Onyshchenko, L.A. Karachevtseva, O.O. Lytvynenko, M.M. Plakhotnyuk, O.Y. Stronska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2017. — Т. 20, № 3. — С. 325-329. — Бібліогр.: 18 назв. — англ.
1560-8034
PACS: 72.80.Cw
https://nasplib.isofts.kiev.ua/handle/123456789/214951
https://doi.org/10.15407/spqeo20.03.325
We calculated the dependence of the effective minority-carrier lifetime in black-silicon nano-textured with cones and pyramids on the diameter of the cone base, the side of the pyramid base, and the height of the cone and pyramid. The numerical calculation shows that the n-type polished plate of single-crystal silicon and the n-type plate of black silicon have a high minority-carrier lifetime in both the bulk and on the silicon surface, indicating high purity of both the bulk and the surface. However, the measured experimentally effective lifetime of minority carriers in the n-type black silicon is 1.55 ms and is determined by the surface lifetime. The measured effective lifetime of minority charge carriers in the p-type polished silicon is 1.24 ms. The minority carrier lifetime in the bulk of the polished p-type silicon is lower than the surface one.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
Article
published earlier
spellingShingle Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
Onyshchenko, V.F.
Karachevtseva, L.A.
Lytvynenko, O.O.
Plakhotnyuk, M.M.
Stronska, O.Y.
title Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
title_full Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
title_fullStr Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
title_full_unstemmed Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
title_short Effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
title_sort effective lifetime of minority carriers in black silicon nano-textured by cones and pyramids
url https://nasplib.isofts.kiev.ua/handle/123456789/214951
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