Bacherikov, Y., Konakova, R., Okhrimenko, O., Berezovska, N., Kapitanchuk, L., & Svetlichnyi, A. (2017). Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Bacherikov, Yu.Yu, R.V Konakova, O.B Okhrimenko, N.I Berezovska, L.M Kapitanchuk, та A.M Svetlichnyi. "Optical Properties of Thin Erbium Oxide Films Formed by Rapid Thermal Annealing on SiC Substrates with Different Structures." Semiconductor Physics Quantum Electronics & Optoelectronics 2017.
Стиль цитування MLA (8-ме видання)Bacherikov, Yu.Yu, et al. "Optical Properties of Thin Erbium Oxide Films Formed by Rapid Thermal Annealing on SiC Substrates with Different Structures." Semiconductor Physics Quantum Electronics & Optoelectronics, 2017.