APA (7th ed.) Citation

Bacherikov, Y., Konakova, R., Okhrimenko, O., Berezovska, N., Kapitanchuk, L., & Svetlichnyi, A. (2017). Optical properties of thin erbium oxide films formed by rapid thermal annealing on SiC substrates with different structures. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Bacherikov, Yu.Yu, R.V Konakova, O.B Okhrimenko, N.I Berezovska, L.M Kapitanchuk, and A.M Svetlichnyi. "Optical Properties of Thin Erbium Oxide Films Formed by Rapid Thermal Annealing on SiC Substrates with Different Structures." Semiconductor Physics Quantum Electronics & Optoelectronics 2017.

MLA (8th ed.) Citation

Bacherikov, Yu.Yu, et al. "Optical Properties of Thin Erbium Oxide Films Formed by Rapid Thermal Annealing on SiC Substrates with Different Structures." Semiconductor Physics Quantum Electronics & Optoelectronics, 2017.

Warning: These citations may not always be 100% accurate.