Be-ion-implanted p-n InSb diode for infrared applications. Modeling, fabrication, and characterization

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2018
• Hauptverfasser: Korotyeyev, V.V., Kochelap, V.O., Sapon, S.V., Romaniuk, B.M., Melnik, V.P., Dubikovskyi, O.V., Sabov, T.M.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2018
• Schlagworte: Optoelectronics and optoelectronic devices
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/215283
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Be-ion-implanted p-n InSb diode for infrared applications. Modeling, fabrication, and characterization / V.V. Korotyeyev, V.O. Kochelap, S.V. Sapon, B.M. Romaniuk, V.P. Melnik, O.V. Dubikovskyi, T.M. Sabov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2018. — Т. 21, № 3. — С. 294-306. — Бібліогр.: 33 назв. — англ.

Transport theory for modeling the electric characteristics of high-quality p-n diodes has been developed. This theory takes into account a non-uniform profile of p-doping, finite thickness of the quasi-neutral regions, and possible non-uniformity of the bulk recombination coefficient. The theory is...