Vashchenko, V., Yatsenko, I., Kovalenko, Y., Kladko, V., Gudymenko, O., Lytvyn, P., . . . Dorozinsky, G. (2019). Effect of electron-beam treatment of sensor glass substrates for SPR devices on their metrological characteristics. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Vashchenko, V.A, et al. "Effect of Electron-beam Treatment of Sensor Glass Substrates for SPR Devices on Their Metrological Characteristics." Semiconductor Physics Quantum Electronics & Optoelectronics 2019.
Стиль цитування MLA (8-ме видання)Vashchenko, V.A, et al. "Effect of Electron-beam Treatment of Sensor Glass Substrates for SPR Devices on Their Metrological Characteristics." Semiconductor Physics Quantum Electronics & Optoelectronics, 2019.