Depth Profiling of the Near-Surface Layer for Ge33as12se55 Thin Films
Depth profiles of the near-surface region and chemical composition for amorphous films deposited from Ge33As12Se55 bulk glasses and their changes resulting from six months ageing under ambient conditions have been studied by the methods of Auger electron spectroscopy and X-ray photoelectron spectros...
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| Published in: | Хімія, фізика та технологія поверхні |
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| Date: | 2010 |
| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
Інститут хімії поверхні ім. О.О. Чуйка НАН України
2010
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| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/29005 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Depth Profiling of the Near-Surface Layer for Ge33as12se55 Thin Films / T.N. Shchurova, N.D. Savchenko, K.O. Popovic, N.Yu. Baran // Хімія, фізика та технологія поверхні. — 2010. — Т. 1, № 3. — С. 343-347. — Бібліогр.: 15 назв. — англ. |
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