Degradations of semiconductor devices under pulsed heat overloading
The linear heat model of degradations of semiconductor devices under pulsed electric overloading has been constructed. Expressions for temporal dependencies of the temperature under different forms of pulse of current are obtained.
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| Published in: | Вопросы атомной науки и техники |
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| Date: | 2000 |
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| Format: | Article |
| Language: | English |
| Published: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2000
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/82375 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Degradations of semiconductor devices under pulsed heat overloading / V.I. Chumakov // Вопросы атомной науки и техники. — 2000. — № 3. — С. 96-98. — Бібліогр.: 7 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-82375 |
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Chumakov, V.I. 2015-05-29T07:28:09Z 2015-05-29T07:28:09Z 2000 Degradations of semiconductor devices under pulsed heat overloading / V.I. Chumakov // Вопросы атомной науки и техники. — 2000. — № 3. — С. 96-98. — Бібліогр.: 7 назв. — англ. 1562-6016 https://nasplib.isofts.kiev.ua/handle/123456789/82375 621.382 The linear heat model of degradations of semiconductor devices under pulsed electric overloading has been constructed. Expressions for temporal dependencies of the temperature under different forms of pulse of current are obtained. en Національний науковий центр «Харківський фізико-технічний інститут» НАН України Вопросы атомной науки и техники Рlasma Dynamics and Plasma-Wall Interaction Degradations of semiconductor devices under pulsed heat overloading Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Degradations of semiconductor devices under pulsed heat overloading |
| spellingShingle |
Degradations of semiconductor devices under pulsed heat overloading Chumakov, V.I. Рlasma Dynamics and Plasma-Wall Interaction |
| title_short |
Degradations of semiconductor devices under pulsed heat overloading |
| title_full |
Degradations of semiconductor devices under pulsed heat overloading |
| title_fullStr |
Degradations of semiconductor devices under pulsed heat overloading |
| title_full_unstemmed |
Degradations of semiconductor devices under pulsed heat overloading |
| title_sort |
degradations of semiconductor devices under pulsed heat overloading |
| author |
Chumakov, V.I. |
| author_facet |
Chumakov, V.I. |
| topic |
Рlasma Dynamics and Plasma-Wall Interaction |
| topic_facet |
Рlasma Dynamics and Plasma-Wall Interaction |
| publishDate |
2000 |
| language |
English |
| container_title |
Вопросы атомной науки и техники |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| format |
Article |
| description |
The linear heat model of degradations of semiconductor devices under pulsed electric overloading has been constructed. Expressions for temporal dependencies of the temperature under different forms of pulse of current are obtained.
|
| issn |
1562-6016 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/82375 |
| citation_txt |
Degradations of semiconductor devices under pulsed heat overloading / V.I. Chumakov // Вопросы атомной науки и техники. — 2000. — № 3. — С. 96-98. — Бібліогр.: 7 назв. — англ. |
| work_keys_str_mv |
AT chumakovvi degradationsofsemiconductordevicesunderpulsedheatoverloading |
| first_indexed |
2025-12-07T18:59:33Z |
| last_indexed |
2025-12-07T18:59:33Z |
| _version_ |
1850877121094746112 |