Похибки вимірювань референтних матриць Мюллера в системі Мюллер-матричного картографування біологічних шарів
Analysis of errors experimental determination values of the elements of the Mueller matrix layer structures with linear birefringence in the two-dimensional mapping Mueller-matrix system within the statistics, correlation and fractal approaches was presented in this article.
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| Datum: | 2015 |
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| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | Ukrainian |
| Veröffentlicht: |
Vinnytsia National Technical University
2015
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| Schlagworte: | |
| Online Zugang: | https://oeipt.vntu.edu.ua/index.php/oeipt/article/view/409 |
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| Назва журналу: | Optoelectronic Information-Power Technologies |
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Optoelectronic Information-Power Technologies| Zusammenfassung: | Analysis of errors experimental determination values of the elements of the Mueller matrix layer structures with linear birefringence in the two-dimensional mapping Mueller-matrix system within the statistics, correlation and fractal approaches was presented in this article. |
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