МЕТРИЧНІ ОЗНАКИ В ДВОВИМІРНОМУ ТА ТРИВИМІРНОМУ ПРОСТОРІ
In this paper, one of the stages of image recognition, coding and analysis of information that is successfully used in artificial intelligence methods is considered. The proposed symbolic description of the image the "center-pattern" is presented in a compressed form and provides simpler t...
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| Datum: | 2018 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Ukrainian |
| Veröffentlicht: |
Vinnytsia National Technical University
2018
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| Schlagworte: | |
| Online Zugang: | https://oeipt.vntu.edu.ua/index.php/oeipt/article/view/478 |
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| Назва журналу: | Optoelectronic Information-Power Technologies |
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Optoelectronic Information-Power Technologies| Zusammenfassung: | In this paper, one of the stages of image recognition, coding and analysis of information that is successfully used in artificial intelligence methods is considered. The proposed symbolic description of the image the "center-pattern" is presented in a compressed form and provides simpler transformations for the allocation of metric features. The created standards, that consider the properties of the mathematical model, expand the information space of features that are acceptable for analyzing flat and spatial images in technical devices. For hardware implementation in each specific case choose compromise options and provide image processing in real-time systems. The implementation of the processing unit in such recognition systems using nanotechnology allows achieving high performance, providing high speed, information density, wide bandwidth and low transmission costs. |
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