Особливості виявлення еталонного зображення на напівтоновому зображенні за методом бінарних зрізів

The possibility of creating new effective approaches and methods for the operation of visual systems of mobile works for the identification of tasks and objects of objects is due to the requirements of today. The work method is an analysis of the features of halftone image processing using the metho...

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Bibliographische Detailangaben
Datum:2024
Hauptverfasser: Скорюкова, Я.Г., Мартинюк, Т.Б., Марков, С.М., Кокушкін, В.М.
Format: Artikel
Sprache:Ukrainian
Veröffentlicht: Vinnytsia National Technical University 2024
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Online Zugang:https://oeipt.vntu.edu.ua/index.php/oeipt/article/view/686
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Назва журналу:Optoelectronic Information-Power Technologies

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Optoelectronic Information-Power Technologies
Beschreibung
Zusammenfassung:The possibility of creating new effective approaches and methods for the operation of visual systems of mobile works for the identification of tasks and objects of objects is due to the requirements of today. The work method is an analysis of the features of halftone image processing using the method of binary slices to identify a reference image in the field of the current image. The methods of analysis, abstraction and analogy were used as research methods. Separate articles offer an approach to complementing a reference halftone image on a current halftone image. To do this, we note the features of using the method of binary slices for processing a halftone image in combination with methods that allow you to destroy the reference binary image on the current binary image. The proposed approach includes a step of forming a set of binary slices of the halftone current image, a step of forming a set of binary slices of the halftone reference image, a step of matching the binary slices of the reference to the binary slices of the current image, a step of determining the location of each binary slice of the reference on the corresponding slice of the current image, and a step analysis of the obtained results and determination of the location of the halftone reference image on the halftone current image. A solution is proposed using a specific example. The practical value of the proposed approach is that a complex halftone image with a large number of brightness levels can be reduced to simple binary matrices, most of which are simply excluded from the processing process. At the same time, there remains a choice of the method of determining the binary slice of the standard on the field of the binary slice of the current image.