Особливості структури сколотих поверхонь шаруватих кристалів GaSe‹Sn›
The processes of formation of nanosized defects on the surfaces of layered crystals and the formation of semi-conductor nanostructures on them have been studied. The atomic force microscopy method for examination of the surface morphological characteristics has been used. Morphological features of n...
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| Datum: | 2011 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | Russisch |
| Veröffentlicht: |
Chuiko Institute of Surface Chemistry National Academy of Sciences of Ukraine
2011
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| Online Zugang: | https://www.cpts.com.ua/index.php/cpts/article/view/125 |
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| Назва журналу: | Chemistry, Physics and Technology of Surface |